A Comparative Analysis on a Limited Image Dataset for Accurately Detecting Improperly Polished Surfaces for Industrial Applications
The objective of this study is to identify the optimal object detection architecture for training on a specific type of defect detection, namely incorrectly polished surfaces on aluminium elements. In order to facilitate a meaningful comparison of the various architectures, a maximum training time of approximately one hour was established for each architecture. Using the Darknet framework and a specific dataset, five architectures were compared (for the time being). The parameters of the various architectures, including network size, number of batches, and so forth, were modified according to a well-defined and systematic procedure. The preliminary findings indicate that the YOLOv4-tiny network exhibits superior training performance on this dataset, rendering it an optimal choice for industrial applications. This research provides support to small and medium-sized enterprises (SMEs) by identifying effective object detection architectures for quality control and highlighting avenues for advancing AI-driven defect detection in manufacturing.
Authors
- Matteo-Claudio Palpacelli (ORCID: https://orcid.org/0000-0001-6931-6618)
- Albin Bajrami (ORCID: https://orcid.org/0009-0002-3207-4867)
- Gaetano Lettera (ORCID: https://orcid.org/0000-0002-6650-1786)
- Simone Pantanetti
Institutions
- Marche Polytechnic University (IT)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/mesa61532.2024.10704894
- Citations
- 1
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 0.35