Hardening a RISC-V Softcore for Embedded Aerospace Applications in SRAM-based FPGA

We investigate the implementation of triple modular redundancy (TMR) with different number of voters in a softcore RISC-V microprocessor to mitigate radiation-induced faults in the configuration memory (CRAM) of SRAM-based FPGA. The case-study microprocessor is the Steel Core implemented in AMD Xilinx 7-Series/Zynq-7000 device, executing benchmark software on the FreeRTOS operating system. We implemented coarse-grained TMR (CGTMR) and fine-grained distributed TMR (FGDTMR) using an automated redundancy and voter insertion tool. TMR is used in combination with memory scrubber featured by the FPGA hardware, which uses error correction codes (ECC) to revert radiation-induced faults in CRAM. Fault injection in CRAM emulating radiation-induced faults is used to evaluate the benefits of both TMR and ECC. Under fault injection, combining the fault masking capability of TMR with the self-healing by ECC, improved mean time between failures (MTBF) up to 5×. ECC alone did not improve significantly the fault tolerance. Without ECC, FGDTMR improves MTBF in 2×, but at a higher cost in circuit area and resources usage. When combined with ECC, the CGTMR provides fault tolerance comparable to FGDTMR but with 30% less resources usage.

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Publication Details

Published
2024-09-02
DOI
https://doi.org/10.1109/sbcci62366.2024.10703996
Citations
1
Primary Topic
Radiation Effects in Electronics
Type
article
Field-Weighted Citation Impact
0.21

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article

Hardening a RISC-V Softcore for Embedded Aerospace Applications in SRAM-based FPGA

Fernanda Lima Kastensmidt, Fábio Benevenuti, Eduardo Marañon Aguilar
1 citations
Radiation Effects in Electronics
0.21
article

Hardening a RISC-V Softcore for Embedded Aerospace Applications in SRAM-based FPGA

Fernanda Lima Kastensmidt, Fábio Benevenuti, Eduardo Marañon Aguilar
article en
1 citations

Abstract

We investigate the implementation of triple modular redundancy (TMR) with different number of voters in a softcore RISC-V microprocessor to mitigate radiation-induced faults in the configuration memory (CRAM) of SRAM-based FPGA. The case-study microprocessor is the Steel Core implemented in AMD Xilinx 7-Series/Zynq-7000 device, executing benchmark software on the FreeRTOS operating system. We implemented coarse-grained TMR (CGTMR) and fine-grained distributed TMR (FGDTMR) using an automated redundancy and voter insertion tool. TMR is used in combination with memory scrubber featured by the FPGA hardware, which uses error correction codes (ECC) to revert radiation-induced faults in CRAM. Fault injection in CRAM emulating radiation-induced faults is used to evaluate the benefits of both TMR and ECC. Under fault injection, combining the fault masking capability of TMR with the self-healing by ECC, improved mean time between failures (MTBF) up to 5×. ECC alone did not improve significantly the fault tolerance. Without ECC, FGDTMR improves MTBF in 2×, but at a higher cost in circuit area and resources usage. When combined with ECC, the CGTMR provides fault tolerance comparable to FGDTMR but with 30% less resources usage.

Universidade Federal do Rio Grande do Sul (BR)
Office of Naval Research
Openalex Percentile: Top 47%
Radiation Effects in Electronics
0.21
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