Theory for measuring electric charge density of a ring from scanning force microscopy

We consider a ring that carries an arbitrary electric charge density in the presence of a scanning force microscopy tip. We propose an algorithm that predicts this charge density from knowledge of the electrostatic ring-tip contribution to the total scanning force microscopy force–distance curves. We first solve the direct electrostatic problem of finding the electrostatic forces by the ring on a scanning force microscopy conducting probe. These forces are in the pN and nN range and, therefore, measurable with current technologies. Finally, we describe a method based on the least squares minimization method to measure the charge on the ring.

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Publication Details

Journal
AIP Advances
Published
2024-10-01
DOI
https://doi.org/10.1063/5.0221217
Citations
1
Primary Topic
Force Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.34
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article

Theory for measuring electric charge density of a ring from scanning force microscopy

Fredy R. Zypman, Moshe Gordon, B. Goykadosh, Y. Magendzo
1 citations
AIP Advances
Force Microscopy Techniques and Applications
0.34
article

Theory for measuring electric charge density of a ring from scanning force microscopy

Fredy R. Zypman, Moshe Gordon, B. Goykadosh, Y. Magendzo
article en
1 citations

Abstract

We consider a ring that carries an arbitrary electric charge density in the presence of a scanning force microscopy tip. We propose an algorithm that predicts this charge density from knowledge of the electrostatic ring-tip contribution to the total scanning force microscopy force–distance curves. We first solve the direct electrostatic problem of finding the electrostatic forces by the ring on a scanning force microscopy conducting probe. These forces are in the pN and nN range and, therefore, measurable with current technologies. Finally, we describe a method based on the least squares minimization method to measure the charge on the ring.

AIP AdvancesVol. 14(10)
Yeshiva University (US)
Affordable and clean energy
Openalex Percentile: Top 40%
Force Microscopy Techniques and Applications
0.34
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