Non-Line-of-Sight Imaging by Linearized Inverse Scattering Method Based on Physical Optics

We report on the imaging method for targets located in non-line-of-sight (NLOS) environment using the inverse scattering method. We considered the application of the linearized inverse scattering method with the physical optics approximation for the metal scattering problem in the NLOS environment. By assuming geometry of the NLOS environment known, we can obtain the numerical Green’s function that connects the observation points and the imaging region and enables the application of the inverse scattering method to NLOS targets. We applied the method on a T-junction as a typical NLOS environment and validated the 2D imaging of scatterers located in NLOS region through 3D electromagnetic simulations. We confirmed that the resulting images reflect the position and size of the scatterers on the imaging plane. Therefore, the effectiveness of this imaging method is verified.

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Publication Details

Published
2024-09-02
DOI
https://doi.org/10.1109/iceaa61917.2024.10701790
Primary Topic
Advanced Optical Sensing Technologies
Type
article
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article

Non-Line-of-Sight Imaging by Linearized Inverse Scattering Method Based on Physical Optics

Yoshio Inasawa, Shouhei Kidera, Yasuhiro Nishioka, Hiroshi Suenobu et al.
Advanced Optical Sensing Technologies
article

Non-Line-of-Sight Imaging by Linearized Inverse Scattering Method Based on Physical Optics

Yoshio Inasawa, Shouhei Kidera, Yasuhiro Nishioka, Hiroshi Suenobu, Takayuki Nakanishi
article en

Abstract

We report on the imaging method for targets located in non-line-of-sight (NLOS) environment using the inverse scattering method. We considered the application of the linearized inverse scattering method with the physical optics approximation for the metal scattering problem in the NLOS environment. By assuming geometry of the NLOS environment known, we can obtain the numerical Green’s function that connects the observation points and the imaging region and enables the application of the inverse scattering method to NLOS targets. We applied the method on a T-junction as a typical NLOS environment and validated the 2D imaging of scatterers located in NLOS region through 3D electromagnetic simulations. We confirmed that the resulting images reflect the position and size of the scatterers on the imaging plane. Therefore, the effectiveness of this imaging method is verified.

University of Electro-Communications (JP), Mitsubishi Electric (Japan) (JP)
Openalex Percentile: Top 86%
Advanced Optical Sensing Technologies
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