Diffraction by Planar Junctions of Uniaxial Chiral Half-Planes
This contribution assesses the plane wave diffraction caused by the edge discontinuity of a planar junction formed by two uniaxial chiral half-sheets. The incidence direction is supposed to be oblique with respect to the discontinuity. Each lossless half-sheet is anisotropic and characterized by permittivity, permeability and chirality parameters. This last parameter combines electric and magnetic fields to electric and magnetic flux densities in constitutive relations. Moreover, permittivity and permeability values along the optical axis, which is perpendicular to the sheet surfaces, are different from the values associated to the transverse axes.
Authors
- Rocco Guerriero (ORCID: https://orcid.org/0000-0002-4966-6343)
- Giovanni Riccio (ORCID: https://orcid.org/0000-0002-6594-6820)
- Flaminio Ferrara (ORCID: https://orcid.org/0000-0002-3286-0879)
- F. Chiadini (ORCID: https://orcid.org/0000-0002-9339-8622)
- Gianluca Gennarelli (ORCID: https://orcid.org/0000-0002-3600-5327)
Institutions
- University of Salerno (IT)
- I.R.C.C.S. Oasi Maria SS (IT)
Publication Details
- Published
- 2024-09-02
- DOI
- https://doi.org/10.1109/iceaa61917.2024.10701770
- Primary Topic
- X-ray Diffraction in Crystallography
- Type
- article
- Field-Weighted Citation Impact
- 0.00