Diffraction by Planar Junctions of Uniaxial Chiral Half-Planes

This contribution assesses the plane wave diffraction caused by the edge discontinuity of a planar junction formed by two uniaxial chiral half-sheets. The incidence direction is supposed to be oblique with respect to the discontinuity. Each lossless half-sheet is anisotropic and characterized by permittivity, permeability and chirality parameters. This last parameter combines electric and magnetic fields to electric and magnetic flux densities in constitutive relations. Moreover, permittivity and permeability values along the optical axis, which is perpendicular to the sheet surfaces, are different from the values associated to the transverse axes.

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Published
2024-09-02
DOI
https://doi.org/10.1109/iceaa61917.2024.10701770
Primary Topic
X-ray Diffraction in Crystallography
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article
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article

Diffraction by Planar Junctions of Uniaxial Chiral Half-Planes

Rocco Guerriero, Giovanni Riccio, Flaminio Ferrara, F. Chiadini et al.
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X-ray Diffraction in Crystallography
article

Diffraction by Planar Junctions of Uniaxial Chiral Half-Planes

Rocco Guerriero, Giovanni Riccio, Flaminio Ferrara, F. Chiadini, Gianluca Gennarelli
article en

Abstract

This contribution assesses the plane wave diffraction caused by the edge discontinuity of a planar junction formed by two uniaxial chiral half-sheets. The incidence direction is supposed to be oblique with respect to the discontinuity. Each lossless half-sheet is anisotropic and characterized by permittivity, permeability and chirality parameters. This last parameter combines electric and magnetic fields to electric and magnetic flux densities in constitutive relations. Moreover, permittivity and permeability values along the optical axis, which is perpendicular to the sheet surfaces, are different from the values associated to the transverse axes.

University of Salerno (IT), I.R.C.C.S. Oasi Maria SS (IT)
Openalex Percentile: Top 89%
X-ray Diffraction in Crystallography
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