A Statistical Explanation of CDM Qualification Variability

CDM testing is known to sometimes have qualification reproducibility problems. This paper discusses possible sources of variability and two statistical approaches to model their effects on test results. The methodology replicates observed qualification result variations and can be used to compare expected results for different qualification settings.

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Published
2024-09-16
DOI
https://doi.org/10.23919/eos/esd61719.2024.10702104
Primary Topic
Electronic Packaging and Soldering Technologies
Type
article
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article

A Statistical Explanation of CDM Qualification Variability

Joop Verwijst, Theo Smedes, Wolfgang Scheucher, Sheela Verwoerd
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Electronic Packaging and Soldering Technologies
article

A Statistical Explanation of CDM Qualification Variability

Joop Verwijst, Theo Smedes, Wolfgang Scheucher, Sheela Verwoerd
article en

Abstract

CDM testing is known to sometimes have qualification reproducibility problems. This paper discusses possible sources of variability and two statistical approaches to model their effects on test results. The methodology replicates observed qualification result variations and can be used to compare expected results for different qualification settings.

NXP (Netherlands) (NL)
Openalex Percentile: Top 85%
Electronic Packaging and Soldering Technologies
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A Statistical Explanation of CDM Qualification Variability — Joop Verwijst, Theo Smedes, et al. · (2024) | TGRS Research Map | TGRS