Extracting Permittivity and Permeability using a Position-Insensitive and Calibration-Independent Transmission/Reflection Method in a Rectangular Waveguide
Classic methods for extracting material characteristics require multiple known measurements to ensure an accurate calibration of the network analyzer. Caijun et al. demonstrated a position-insensitive and calibration-independent (PiCi) transmission/reflection method in a coaxial line to extract a material’s permittivity using only one sample and one uncalibrated empty measurement. This paper proposes a method starting with the same function, manipulated to use one empty measurement and then two sample measurements of different thicknesses. Denemark et al. adopted the PiCi method for rectangular waveguide which resulted in inaccurate permittivity data when compared to the calibrated solution. Once detector mismatch corrections were applied, the PiCi method produced accurate results. Upon applying detector mismatch corrections and using a 2-D numerical root search, permittivity and permeability material characteristics are now successfully extracted from the PiCi two-thickness method.
Authors
- Michael J. Havrilla (ORCID: https://orcid.org/0000-0003-2330-0658)
- Hirsch M. Chizever (ORCID: https://orcid.org/0000-0002-2272-1592)
- J. C. Denemark
Institutions
- Delta Air Lines (United States) (US)
- Sigma Xi (US)
- U.S. Air Force Institute of Technology (US)
Publication Details
- Published
- 2024-09-09
- DOI
- https://doi.org/10.1109/metamaterials62190.2024.10703233
- Primary Topic
- Photonic and Optical Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.00