Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning
The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.
Authors
- Gan Xiang
- Yihong Ji (ORCID: https://orcid.org/0009-0003-1507-2269)
- Junle Qu (ORCID: https://orcid.org/0000-0001-7833-4711)
- Bin Yu (ORCID: https://orcid.org/0000-0002-8698-0155)
- Heng Li (ORCID: https://orcid.org/0000-0002-2196-6520)
- Hanzhe Wu (ORCID: https://orcid.org/0009-0001-0318-9414)
- Danni Chen (ORCID: https://orcid.org/0000-0002-6003-8284)
Institutions
- Shenzhen University (CN)
Publication Details
- Journal
- IEEE photonics journal
- Published
- 2024-10-08
- DOI
- https://doi.org/10.1109/jphot.2024.3476514
- Citations
- 2
- Primary Topic
- Semiconductor Quantum Structures and Devices
- Type
- article
- Field-Weighted Citation Impact
- 0.68