Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning

The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.

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Publication Details

Journal
IEEE photonics journal
Published
2024-10-08
DOI
https://doi.org/10.1109/jphot.2024.3476514
Citations
2
Primary Topic
Semiconductor Quantum Structures and Devices
Type
article
Field-Weighted Citation Impact
0.68
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article

Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning

Gan Xiang, Yihong Ji, Junle Qu, Bin Yu et al.
2 citations
IEEE photonics journal
Semiconductor Quantum Structures and Devices
0.68
article

Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning

Gan Xiang, Yihong Ji, Junle Qu, Bin Yu, Heng Li, Hanzhe Wu, Danni Chen
article en
2 citations

Abstract

The point-by point 3D scanning strategy adopted in Stimulated Emission Depletion Microscopy (STED) is time-consuming. The 3D scanning can be replaced with a 2D scanning in the non-diffracting Bessel-Bessel STED (BB-STED). In order to extract the excited emitters’ axial information in BB-STED, we propose to encode axial information by using a detection optical path with single-helix PSF, and then predict the depths of the emitters with deep learning. Simulation demonstrated that, for dense emitters in a depth range of 4 µm, an axial precision of ∼35 nm can be achieved. Our method also works for experimental data, and an axial precision of ∼63 nm can be achieved.

IEEE photonics journalVol. 16(6)
Shenzhen University (CN)
Openalex Percentile: Top 31%
Semiconductor Quantum Structures and Devices
0.68
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Localizing Axial Dense Emitters Based on Single-Helix Point Spread Function and Deep Learning — Gan Xiang, Yihong Ji, et al. · IEEE photonics journal (2024) | TGRS Research Map | TGRS