Multicolor structured illumination super-resolution microscopic ghost imaging

Structured illumination microscopy (SIM), as one of the mainstream super-resolution optical microscopy imaging techniques, takes the advantages of fast imaging because of wide-field illumination, which is suitable to the multi-color live cell imaging. However, multi-color imaging measures each spectral image separately, so the imaging speed of is limited. In addition, the spatial-resolution improvement of SIM depends on the modulation frequency of structured pattern. To further improve the imaging resolution, we use a spectral imaging method, i.e., passive ghost imaging, in SIM. Simulation results show that the proposed method has superiority in super-resolution, imaging speed and imaging quality than traditional multi-color imaging and multi-color SIM imaging.

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Publication Details

Published
2024-10-08
DOI
https://doi.org/10.1117/12.3039550
Primary Topic
Random lasers and scattering media
Type
article
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Multicolor structured illumination super-resolution microscopic ghost imaging

Shensheng Han, Li‐Qun Chen, Zhentao Liu
Random lasers and scattering media
article

Multicolor structured illumination super-resolution microscopic ghost imaging

Shensheng Han, Li‐Qun Chen, Zhentao Liu
article en

Abstract

Structured illumination microscopy (SIM), as one of the mainstream super-resolution optical microscopy imaging techniques, takes the advantages of fast imaging because of wide-field illumination, which is suitable to the multi-color live cell imaging. However, multi-color imaging measures each spectral image separately, so the imaging speed of is limited. In addition, the spatial-resolution improvement of SIM depends on the modulation frequency of structured pattern. To further improve the imaging resolution, we use a spectral imaging method, i.e., passive ghost imaging, in SIM. Simulation results show that the proposed method has superiority in super-resolution, imaging speed and imaging quality than traditional multi-color imaging and multi-color SIM imaging.

Shanghai Institute of Optics and Fine Mechanics (CN), University of Chinese Academy of Sciences (CN)
Openalex Percentile: Top 82%
Random lasers and scattering media
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