Zero Sequence Injection in Delta-CHB STATCOM: Towards Optimum Silicon Area Through Typical Power IGBT/diode Model

This work quantifies the impact of third harmonic circulating current injection (THCCI) in a Cascaded H-bridge converter in delta configuration (Delta-CHB) for Static Synchronous Compensator (STATCOM) application. The analyses consist of evaluating the impact of THCCI on the silicon area of semiconductor devices. To achieve this objective, this work develops a typical IGBT/Diode model to determine the nominal current of the devices for a given maximum junction temperature. Commercial devices in the voltage classes of 1700 V, 3300 V, 4500 V, and 6500 V were considered, with nominal currents ranging from 150 A to 3600 A. A hybrid approach based on physical-oriented scaling laws and black-box modeling allows to reach a coefficient of determination higher than 79\% for all modeled variables. The results showed an increase of 43.8\% in the active area of the IGBT and 30.87\% in the active area of the diode when the peak cluster current increased by 62\% due to THCCI.

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Publication Details

Journal
Eletrônica de Potência
Published
2024-10-08
DOI
https://doi.org/10.18618/rep.e202437
Citations
5
Primary Topic
Silicon Carbide Semiconductor Technologies
Type
article
Field-Weighted Citation Impact
1.04
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article

Zero Sequence Injection in Delta-CHB STATCOM: Towards Optimum Silicon Area Through Typical Power IGBT/diode Model

J. Franca, Allan Fagner Cupertino, Dayane do Carmo Mendonça, Heverton Augusto Pereira et al.
5 citations
Eletrônica de Potência
Silicon Carbide Semiconductor Technologies
1.04
article

Zero Sequence Injection in Delta-CHB STATCOM: Towards Optimum Silicon Area Through Typical Power IGBT/diode Model

J. Franca, Allan Fagner Cupertino, Dayane do Carmo Mendonça, Heverton Augusto Pereira, Seleme Isaac Seleme Júnior
article en
5 citations

Abstract

This work quantifies the impact of third harmonic circulating current injection (THCCI) in a Cascaded H-bridge converter in delta configuration (Delta-CHB) for Static Synchronous Compensator (STATCOM) application. The analyses consist of evaluating the impact of THCCI on the silicon area of semiconductor devices. To achieve this objective, this work develops a typical IGBT/Diode model to determine the nominal current of the devices for a given maximum junction temperature. Commercial devices in the voltage classes of 1700 V, 3300 V, 4500 V, and 6500 V were considered, with nominal currents ranging from 150 A to 3600 A. A hybrid approach based on physical-oriented scaling laws and black-box modeling allows to reach a coefficient of determination higher than 79\% for all modeled variables. The results showed an increase of 43.8\% in the active area of the IGBT and 30.87\% in the active area of the diode when the peak cluster current increased by 62\% due to THCCI.

Eletrônica de PotênciaVol. 29
Universidade Federal de Juiz de Fora (BR), Universidade Federal de Minas Gerais (BR), Universidade Federal de Viçosa (BR), Federal Center for Technological Education of Minas Gerais (BR)
Affordable and clean energy
Openalex Percentile: Top 23%
Silicon Carbide Semiconductor Technologies
1.04
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