In-situ relative calibration of Bragg crystals with Monte Carlo line ratio analysis

X-ray line emission spectra can thoroughly characterize hot plasmas, especially when line shapes and ratios convey distinct aspects of plasma conditions. However, the high spectral resolution required for observing line shapes is often at odds with the large bandwidth required to observe many line ratios across a wide spectral range. One strategy to obtain high spectral resolution over a wide bandwidth is to use multiple crystals with calibrated reflectivity so that line intensities across different crystals can be compared. Here, we explore the use of a low-resolution, wide-bandwidth mica survey spectrometer to infer relative reflectivity of two high-resolution, narrow-bandwidth quartz crystals. A Monte Carlo error analysis determines comparable x-ray line ratios measured from both spectrometers, resulting in an in situ calibration factor and associated uncertainty for the relative reflectivity of the high-resolution crystals.

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Publication Details

Journal
Review of Scientific Instruments
Published
2024-10-01
DOI
https://doi.org/10.1063/5.0218767
Citations
1
Primary Topic
X-ray Spectroscopy and Fluorescence Analysis
Type
article
Field-Weighted Citation Impact
0.61

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In-situ relative calibration of Bragg crystals with Monte Carlo line ratio analysis

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article

In-situ relative calibration of Bragg crystals with Monte Carlo line ratio analysis

P. C. Efthimion, S. Zahedpour, R. Hollinger, Brian Kraus, S. Malko, Lan Gao, Shawn McPoyle, K. W. Hill, J. J. Rocca, Shoujun Wang, John G. King, E. Kriz, K. Atay
article en
1 citations

Abstract

X-ray line emission spectra can thoroughly characterize hot plasmas, especially when line shapes and ratios convey distinct aspects of plasma conditions. However, the high spectral resolution required for observing line shapes is often at odds with the large bandwidth required to observe many line ratios across a wide spectral range. One strategy to obtain high spectral resolution over a wide bandwidth is to use multiple crystals with calibrated reflectivity so that line intensities across different crystals can be compared. Here, we explore the use of a low-resolution, wide-bandwidth mica survey spectrometer to infer relative reflectivity of two high-resolution, narrow-bandwidth quartz crystals. A Monte Carlo error analysis determines comparable x-ray line ratios measured from both spectrometers, resulting in an in situ calibration factor and associated uncertainty for the relative reflectivity of the high-resolution crystals.

Review of Scientific InstrumentsVol. 95(10)
Princeton University (US), Princeton Plasma Physics Laboratory (US), McGill University (CA), Colorado State University (US)
Fusion Energy Sciences, Princeton Plasma Physics Laboratory
Openalex Percentile: Top 30%
X-ray Spectroscopy and Fluorescence Analysis
0.61
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