A 25-micrometer Single-Photon-Sensitive Kinetic Inductance Detector

We report measurements characterizing the performance of a kinetic inductance detector array designed for a wavelength of 25 microns and very low optical background level suitable for applications such as a far-infrared instrument on a cryogenically cooled space telescope. In a pulse-counting mode of operation at low optical flux, the detectors can resolve individual 25-micron photons. In an integrating mode, the detectors remain photon noise limited over more than 6 orders of magnitude in absorbed power from 70 zW to 200 fW, with a limiting noise equivalent power of <a:math xmlns:a="http://www.w3.org/1998/Math/MathML" display="inline"><a:mrow><a:mn>4.6</a:mn><a:mo>×</a:mo><a:msup><a:mn>10</a:mn><a:mrow><a:mo>−</a:mo><a:mn>20</a:mn></a:mrow></a:msup><a:mtext> </a:mtext><a:mtext> </a:mtext><a:mi mathvariant="normal">W</a:mi><a:mtext> </a:mtext><a:msup><a:mi>Hz</a:mi><a:mrow><a:mo>−</a:mo><a:mn>1</a:mn></a:mrow></a:msup></a:mrow></a:math> at 1 Hz. In addition, the detectors are highly stable with flat power spectra under optical load down to 1 mHz. Operational parameters of the detector are determined including the efficiency of conversion of the incident optical power into quasiparticles in the aluminum absorbing element and the quasiparticle self-recombination constant. Published by the American Physical Society 2024

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Publication Details

Journal
Physical Review X
Published
2024-10-07
DOI
https://doi.org/10.1103/physrevx.14.041005
Citations
15
Primary Topic
Superconducting and THz Device Technology
Type
article
Field-Weighted Citation Impact
4.97

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article

A 25-micrometer Single-Photon-Sensitive Kinetic Inductance Detector

Thomas R. Stevenson, C. M. Bradford, Peter K. Day, P. M. Echternach et al.
15 citations
Physical Review X
Superconducting and THz Device Technology
4.97
article

A 25-micrometer Single-Photon-Sensitive Kinetic Inductance Detector

Thomas R. Stevenson, C. M. Bradford, Peter K. Day, P. M. Echternach, R. Basu Thakur, Shahab O. Dabironezare, Byeong Ho Eom, J. J. A. Baselmans, Nicholas F. Cothard, H. G. LeDuc, Sven van Berkel, Steven Hailey-Dunsheath, Logan Foote, Andrew D. Beyer, R. M. J. Janssen, Christopher G. Albert, Jason Glenn, Elijah Kane
article en
15 citations

Abstract

We report measurements characterizing the performance of a kinetic inductance detector array designed for a wavelength of 25 microns and very low optical background level suitable for applications such as a far-infrared instrument on a cryogenically cooled space telescope. In a pulse-counting mode of operation at low optical flux, the detectors can resolve individual 25-micron photons. In an integrating mode, the detectors remain photon noise limited over more than 6 orders of magnitude in absorbed power from 70 zW to 200 fW, with a limiting noise equivalent power of <a:math xmlns:a="http://www.w3.org/1998/Math/MathML" display="inline"><a:mrow><a:mn>4.6</a:mn><a:mo>×</a:mo><a:msup><a:mn>10</a:mn><a:mrow><a:mo>−</a:mo><a:mn>20</a:mn></a:mrow></a:msup><a:mtext> </a:mtext><a:mtext> </a:mtext><a:mi mathvariant="normal">W</a:mi><a:mtext> </a:mtext><a:msup><a:mi>Hz</a:mi><a:mrow><a:mo>−</a:mo><a:mn>1</a:mn></a:mrow></a:msup></a:mrow></a:math> at 1 Hz. In addition, the detectors are highly stable with flat power spectra under optical load down to 1 mHz. Operational parameters of the detector are determined including the efficiency of conversion of the incident optical power into quasiparticles in the aluminum absorbing element and the quasiparticle self-recombination constant. Published by the American Physical Society 2024

Physical Review XVol. 14(4)
California Institute of Technology (US), Goddard Space Flight Center (US), Jet Propulsion Laboratory (US), Space Research Organisation Netherlands (NL), Delft University of Technology (NL)
National Aeronautics and Space Administration, Oak Ridge Associated Universities, California Institute of Technology, Jet Propulsion Laboratory, Goddard Space Flight Center
Affordable and clean energy
Openalex Percentile: Top 4%
Superconducting and THz Device Technology
4.97
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