Analysis of diffraction gratings displayed in spatial light modulators at the Nyquist limit: Application to the triplicator grating

• A complete analysis of phase diffraction gratings displayed onto a spatial light modulator (SLM) at the spatial resolution limit (Nyquist limit) is provided based on parameters like the pixel size, the fill factor and the phase modulation. • A convolutional approach is adopted that probes very useful to gain physical insight of the different contributions to the diffraction orders. As a result, we provide analytical relations of the diffraction orders intensity as a function of the phase modulation. • A model for the fringing affect affecting the phase gratings really displayed by the SLM is applied that successfully fits the experimental data and shows the smooth of the generated phase profile. • The conditions to obtain a triplicator phase grating (a diffraction grating producing three equally intense zero and ±1 orders) that operates at the SLM resolution limit are presented. In this work we analyze diffraction gratings displayed on a pixelated spatial light modulator (SLM) at its spatial resolution limit (Nyquist limit) i.e., with largest diffraction angle, where the binary phase profile is the only alternative. Their implementation is influenced by the effect of a sinc envelope and the multiple replicas of the diffraction pattern that arise from the SLM pixelation, where the fill factor plays an essential role. We use the Fourier transform theory to analyze the binary phase grating in a pixelated device in terms of the pixel size, fill factor and phase difference between the two levels in the grating. This convolutional approach probes very useful to gain physical insight of the different contributions to the diffraction orders, and analytical expressions for the complex amplitude coefficients and intensities are obtained. Experimental verification is provided by encoding binary phase triplicator gratings with different periods on a high-resolution liquid-crystal on silicon SLM. The effect of the device pixelation and pixel crosstalk on the diffraction efficiency and on the conditions to obtain a Nyquist triplicator phase grating are studied. These results can be interesting for applications requiring programmable and large beam steering angles.

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Publication Details

Journal
Optics and Lasers in Engineering
Published
2024-10-07
DOI
https://doi.org/10.1016/j.optlaseng.2024.108628
Citations
5
Primary Topic
Optical Coatings and Gratings
Type
article
Field-Weighted Citation Impact
0.89

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article

Analysis of diffraction gratings displayed in spatial light modulators at the Nyquist limit: Application to the triplicator grating

Marı́a del Mar Sánchez-López, Ignacio Moreno, Shang Gao
5 citations
Optics and Lasers in Engineering
Optical Coatings and Gratings
0.89
article

Analysis of diffraction gratings displayed in spatial light modulators at the Nyquist limit: Application to the triplicator grating

Marı́a del Mar Sánchez-López, Ignacio Moreno, Shang Gao
article en
5 citations

Abstract

• A complete analysis of phase diffraction gratings displayed onto a spatial light modulator (SLM) at the spatial resolution limit (Nyquist limit) is provided based on parameters like the pixel size, the fill factor and the phase modulation. • A convolutional approach is adopted that probes very useful to gain physical insight of the different contributions to the diffraction orders. As a result, we provide analytical relations of the diffraction orders intensity as a function of the phase modulation. • A model for the fringing affect affecting the phase gratings really displayed by the SLM is applied that successfully fits the experimental data and shows the smooth of the generated phase profile. • The conditions to obtain a triplicator phase grating (a diffraction grating producing three equally intense zero and ±1 orders) that operates at the SLM resolution limit are presented. In this work we analyze diffraction gratings displayed on a pixelated spatial light modulator (SLM) at its spatial resolution limit (Nyquist limit) i.e., with largest diffraction angle, where the binary phase profile is the only alternative. Their implementation is influenced by the effect of a sinc envelope and the multiple replicas of the diffraction pattern that arise from the SLM pixelation, where the fill factor plays an essential role. We use the Fourier transform theory to analyze the binary phase grating in a pixelated device in terms of the pixel size, fill factor and phase difference between the two levels in the grating. This convolutional approach probes very useful to gain physical insight of the different contributions to the diffraction orders, and analytical expressions for the complex amplitude coefficients and intensities are obtained. Experimental verification is provided by encoding binary phase triplicator gratings with different periods on a high-resolution liquid-crystal on silicon SLM. The effect of the device pixelation and pixel crosstalk on the diffraction efficiency and on the conditions to obtain a Nyquist triplicator phase grating are studied. These results can be interesting for applications requiring programmable and large beam steering angles.

Optics and Lasers in EngineeringVol. 184
Universitat de Miguel Hernández d'Elx (ES)
Ministerio de Ciencia e Innovación, Conselleria de Cultura, Educación y Ciencia, Generalitat Valenciana
Climate action
Openalex Percentile: Top 29%
Optical Coatings and Gratings
0.89
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