Multi-parameter simultaneous extraction with a novel microwave sensor based on coupled resonators

This work presents a microwave resonant multi-parameter sensor devoted to the simultaneous extraction of three characteristics of a homogeneous solid sample: its dielectric permittivity, its loss tangent and its thickness. The device is composed of three coupled resonators in two different substrate boards, having the sample between the boards, in a sandwich configuration. Presence of the sample impacts the electrical response of the device, not only influencing resonators, but also by affecting inter-resonator couplings. A method to analyse the response of the device, allowing for the extraction of the desired characteristics of the sample is proposed, as well as an experimental calibration procedure. The model is built upon 990 simulations, calibrated with three reference-samples measurements and then tested over 18 experimental measurements, with good results, thereby validating the multi-parameter sensing approach.

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Publication Details

Journal
Scientific Reports
Published
2024-10-04
DOI
https://doi.org/10.1038/s41598-024-72061-3
Citations
8
Primary Topic
Microwave and Dielectric Measurement Techniques
Type
article
Field-Weighted Citation Impact
1.67

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article

Multi-parameter simultaneous extraction with a novel microwave sensor based on coupled resonators

Benjamin Potelon, Carlos G. Juan, Héctor García García, Cédric Quendo et al.
8 citations
Scientific Reports
Microwave and Dielectric Measurement Techniques
1.67
article

Multi-parameter simultaneous extraction with a novel microwave sensor based on coupled resonators

Benjamin Potelon, Carlos G. Juan, Héctor García García, Cédric Quendo, Anyela Aquino
article en
8 citations

Abstract

This work presents a microwave resonant multi-parameter sensor devoted to the simultaneous extraction of three characteristics of a homogeneous solid sample: its dielectric permittivity, its loss tangent and its thickness. The device is composed of three coupled resonators in two different substrate boards, having the sample between the boards, in a sandwich configuration. Presence of the sample impacts the electrical response of the device, not only influencing resonators, but also by affecting inter-resonator couplings. A method to analyse the response of the device, allowing for the extraction of the desired characteristics of the sample is proposed, as well as an experimental calibration procedure. The model is built upon 990 simulations, calibrated with three reference-samples measurements and then tested over 18 experimental measurements, with good results, thereby validating the multi-parameter sensing approach.

Scientific ReportsVol. 14(1)
Universitat de Miguel Hernández d'Elx (ES), Centre National de la Recherche Scientifique (FR), Université de Bretagne Occidentale (FR), Universidad Politécnica de Cartagena (ES), Laboratoire des Sciences et Techniques de l’Information de la Communication et de la Connaissance (FR), IMT Atlantique (FR), National University of Engineering (PE), Universidad de Málaga (ES)
Generalitat Valenciana, Région Bretagne, Agencia Estatal de Investigación, European Social Fund
Openalex Percentile: Top 15%
Microwave and Dielectric Measurement Techniques
1.67
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