RCS Near-Field Measurement Method Based on ISAR Imaging and Scattering Center Extraction

This study combines inverse synthetic aperture radar (ISAR) imaging with scattering center extraction techniques to explore an efficient near-field-to-far-field conversion method to address the challenge of accurately measuring target radar cross sections (RCS) in a near-field test environment. We investigate two such conversion methods: the CLEAN algorithm and the direct reconstruction method. We conduct an in-depth study of scattering center extraction and point spread function construction, and thoroughly examine and validate these methods through simulation experiments on different targets to demonstrate their effectiveness and accuracy in converting near-field measurements to far-field RCS predictions.

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Publication Details

Published
2024-08-16
DOI
https://doi.org/10.1109/aces-china62474.2024.10699719
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
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article
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article

RCS Near-Field Measurement Method Based on ISAR Imaging and Scattering Center Extraction

Mingzhao Song, Chao Sun, Dongjun Hu
Integrated Circuits and Semiconductor Failure Analysis
article

RCS Near-Field Measurement Method Based on ISAR Imaging and Scattering Center Extraction

Mingzhao Song, Chao Sun, Dongjun Hu
article en

Abstract

This study combines inverse synthetic aperture radar (ISAR) imaging with scattering center extraction techniques to explore an efficient near-field-to-far-field conversion method to address the challenge of accurately measuring target radar cross sections (RCS) in a near-field test environment. We investigate two such conversion methods: the CLEAN algorithm and the direct reconstruction method. We conduct an in-depth study of scattering center extraction and point spread function construction, and thoroughly examine and validate these methods through simulation experiments on different targets to demonstrate their effectiveness and accuracy in converting near-field measurements to far-field RCS predictions.

Harbin Engineering University (CN)
Openalex Percentile: Top 85%
Integrated Circuits and Semiconductor Failure Analysis
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RCS Near-Field Measurement Method Based on ISAR Imaging and Scattering Center Extraction — Mingzhao Song, Chao Sun, et al. · (2024) | TGRS Research Map | TGRS