High Efficient Automatic Test Method for SIP Products

In order to satisfy the requirement of temperature test for (System In a Package) SIP products, a high efficiency automatic test sorting system for temperature is developed. To solve the problem of low efficiency of temperature test for SIP products, select the temperature change module to open the sealed heat preservation cavity to realize local temperature control and avoid affecting the running accuracy of the device. The automatic manipulator and high-precision visual recognition system are selected, and the adjustable automatic rotating tray is adopted to realize the automatic temperature test of SIP products. Finally, assist data processing program, automatically generate test report. Finally, the temperature automatic test and sorting system is developed, which is unattended for 24 hours and increased the test efficiency by 350%.

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Publication Details

Published
2024-08-16
DOI
https://doi.org/10.1109/aces-china62474.2024.10699798
Primary Topic
VLSI and Analog Circuit Testing
Type
article
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article

High Efficient Automatic Test Method for SIP Products

Zehong Yan, Tao Li, Pei Liu
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VLSI and Analog Circuit Testing
article

High Efficient Automatic Test Method for SIP Products

Zehong Yan, Tao Li, Pei Liu
article en

Abstract

In order to satisfy the requirement of temperature test for (System In a Package) SIP products, a high efficiency automatic test sorting system for temperature is developed. To solve the problem of low efficiency of temperature test for SIP products, select the temperature change module to open the sealed heat preservation cavity to realize local temperature control and avoid affecting the running accuracy of the device. The automatic manipulator and high-precision visual recognition system are selected, and the adjustable automatic rotating tray is adopted to realize the automatic temperature test of SIP products. Finally, assist data processing program, automatically generate test report. Finally, the temperature automatic test and sorting system is developed, which is unattended for 24 hours and increased the test efficiency by 350%.

Xidian University (CN)
Openalex Percentile: Top 83%
VLSI and Analog Circuit Testing
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High Efficient Automatic Test Method for SIP Products — Zehong Yan, Tao Li, et al. · (2024) | TGRS Research Map | TGRS