Measurement-based Transistor Modeling and Evaluation

In order to construct more accurate model for transistor, the measurement-based transistor modeling from I-V and C-V/Q-V characteristics are analyzed in detail.. Moreover, a novel method of radar chart is employed to evaluate the widely used models. Thus, the challenges and prospects on future transistor modeling is addressed.

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Publication Details

Published
2024-08-16
DOI
https://doi.org/10.1109/aces-china62474.2024.10699717
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
0.00

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article

Measurement-based Transistor Modeling and Evaluation

Qian Lin, Shu‐Yue Yang
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VLSI and Analog Circuit Testing
article

Measurement-based Transistor Modeling and Evaluation

Qian Lin, Shu‐Yue Yang
article en

Abstract

In order to construct more accurate model for transistor, the measurement-based transistor modeling from I-V and C-V/Q-V characteristics are analyzed in detail.. Moreover, a novel method of radar chart is employed to evaluate the widely used models. Thus, the challenges and prospects on future transistor modeling is addressed.

Qinghai University (CN)
Chinese Academy of Sciences
Affordable and clean energy
Openalex Percentile: Top 83%
VLSI and Analog Circuit Testing
DOISourceOpenAlex
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Measurement-based Transistor Modeling and Evaluation — Qian Lin, Shu‐Yue Yang · (2024) | TGRS Research Map | TGRS