Mechanisms of Defect-Mediated Memristive Behavior in MoS<sub>2</sub> Monolayer
The switching dynamics of a Au∥V<sub>S<sub>2</sub></sub>@MoS<sub>2</sub> atomristor is explored by first-principles computations of the atomic-configuration energy and electron transport. It is found that external bias can reduce the energy barrier between the two (high- and low-) conduction states, to achieve nonvolatile resistive switching. We find that the force acting on the switching atom is a combination of electrostatic force (while its charge is induced both electrostatically and chemically) and also by electron-wind, whose effect may hinder the writing process at larger bias. The analysis uncovers how the writing and reading processes of the atomristor depend on several factors: (i) atomic structure details of the Au tip; (ii) the space-gap distance between the tip and MoS<sub>2</sub> layer; and (iii) tip metal choice. The fundamental understanding of switching events provides useful guidance for memristor design and possible limitations.
Authors
- Boris I. Yakobson (ORCID: https://orcid.org/0000-0001-8369-3567)
- Yuefei Huang (ORCID: https://orcid.org/0000-0003-4273-753X)
- Evgeni S. Penev (ORCID: https://orcid.org/0000-0002-4783-8316)
Institutions
- Rice University (US)
Publication Details
- Journal
- Nano Letters
- Published
- 2024-10-03
- DOI
- https://doi.org/10.1021/acs.nanolett.4c03792
- Citations
- 3
- Primary Topic
- Advanced Memory and Neural Computing
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- Office of Naval Research