Demonstration of Effective Intrinsic Electron Velocity &gt;10<sup>7</sup> cm/s in Ultrawide Bandgap Al₀.₆₄Ga₀.₃₆N Channel HEMTs

This article reports on the effective intrinsic electron velocity exceeding <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10^{{7}}$ </tex-math></inline-formula> cm/s in high-composition Al<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{{0.64}}\text {Ga}_{{0.36}}$ </tex-math></inline-formula>N channel high-electron-mobility transistors (HEMTs) at peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula>. The small-signal two-port s-parameter measurements were employed at peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula> bias, which enabled us to compute the small-signal parameters and determine the total transit delay. A device with ~245-nm gate length yielded a total transit delay of 8.04 ps corresponding to a peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula> of 19.8 GHz. By segregating the delay components, the intrinsic delay was estimated to be 6.22 ps. However, this intrinsic delay includes the effect of fringe capacitances that were further decoupled to yield the intrinsic transit time. The transit time under the gate was estimated to be 2.12 ps, and thus, the peak effective intrinsic electron velocity was determined to be <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.15\times 10^{{7}}$ </tex-math></inline-formula> cm/s. These findings offer crucial insights for optimizing the design and performance of high-composition AlGaN channel HEMTs at RF power frequencies.

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Publication Details

Journal
IEEE Transactions on Electron Devices
Published
2024-10-03
DOI
https://doi.org/10.1109/ted.2024.3464584
Citations
6
Primary Topic
GaN-based semiconductor devices and materials
Type
article
Field-Weighted Citation Impact
1.87
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article

Demonstration of Effective Intrinsic Electron Velocity >107 cm/s in Ultrawide Bandgap Al₀.₆₄Ga₀.₃₆N Channel HEMTs

Shubhra S. Pasayat, Parthasarathy Seshadri, Chirag Gupta, Kenneth Stephenson et al.
6 citations
IEEE Transactions on Electron Devices
GaN-based semiconductor devices and materials
1.87
article

Demonstration of Effective Intrinsic Electron Velocity >107 cm/s in Ultrawide Bandgap Al₀.₆₄Ga₀.₃₆N Channel HEMTs

Shubhra S. Pasayat, Parthasarathy Seshadri, Chirag Gupta, Kenneth Stephenson, Ruixin Bai, Asif Khan, Jiahao Chen, Zehuan Wang, Md Abdullah Mamun
article en
6 citations

Abstract

This article reports on the effective intrinsic electron velocity exceeding <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$10^{{7}}$ </tex-math></inline-formula> cm/s in high-composition Al<inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$_{{0.64}}\text {Ga}_{{0.36}}$ </tex-math></inline-formula>N channel high-electron-mobility transistors (HEMTs) at peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula>. The small-signal two-port s-parameter measurements were employed at peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula> bias, which enabled us to compute the small-signal parameters and determine the total transit delay. A device with ~245-nm gate length yielded a total transit delay of 8.04 ps corresponding to a peak <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">${f}_{t}$ </tex-math></inline-formula> of 19.8 GHz. By segregating the delay components, the intrinsic delay was estimated to be 6.22 ps. However, this intrinsic delay includes the effect of fringe capacitances that were further decoupled to yield the intrinsic transit time. The transit time under the gate was estimated to be 2.12 ps, and thus, the peak effective intrinsic electron velocity was determined to be <inline-formula xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink"> <tex-math notation="LaTeX">$1.15\times 10^{{7}}$ </tex-math></inline-formula> cm/s. These findings offer crucial insights for optimizing the design and performance of high-composition AlGaN channel HEMTs at RF power frequencies.

IEEE Transactions on Electron DevicesVol. 71(11)
University of Wisconsin–Madison (US), University of South Carolina (US)
Openalex Percentile: Top 14%
GaN-based semiconductor devices and materials
1.87
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