Optimizing the segment anything model for PCB component segmentation in x-ray images through few-shot parameter-efficient fine-tuning

Segmentation of printed circuit board (PCB) components from X-ray images holds paramount significance as it constitutes a crucial step in design extraction and reverse engineering processes. Conventional pretrained deep learning segmentation models demand considerable resources and produce less-than-optimal outcomes and often results in overfitting due to the scarcity of the labeled PCB X-ray data. The Segment Anything Model (SAM), known for its versatility in semantic segmentation tasks, showcases its capability to effectively segment a wide array of objects found in natural images. Nonetheless, it encounters challenges when it comes to the complex design of PCB X-ray images, causing difficulty in accurately segmenting the components present in the circuit boards design. Adapting this foundation model to the unique challenges posed by PCB X-ray images, such as intricate component structures and variations in X-ray artifacts, requires careful modification and optimization. In this study, we propose a customized approach for segmenting components from X-ray images of PCBs that use a modified SAM model with parameter-efficient fine-tuning and few-shot generalization strategies. We introduce modifications to enhance the model’s ability to capture intricate spatial relationships and effectively segment individual components. Our methodology focuses on the efficient adaptation of the foundation model to the unique characteristics of PCB X-ray images, including complex component structures and varying noise conditions. Leveraging few-shot learning techniques, we address the challenge of limited annotated data in the PCB X-ray domain, towards the aim of enabling the model to generalize effectively with minimal fine-tuning. Our work has the potential to pave the way for a novel solution to the challenge of implementing deep learning in a limited dataset by leveraging the capabilities of a foundation model.

Authors

Institutions

Publication Details

Published
2024-10-03
DOI
https://doi.org/10.1117/12.3027646
Citations
2
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.70
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Optimizing the segment anything model for PCB component segmentation in x-ray images through few-shot parameter-efficient fine-tuning

Patrick Craig, Md Mahfuz Al Hasan, Shajib Ghosh, Nitin Varshney et al.
2 citations
Industrial Vision Systems and Defect Detection
0.70
article

Optimizing the segment anything model for PCB component segmentation in x-ray images through few-shot parameter-efficient fine-tuning

Patrick Craig, Md Mahfuz Al Hasan, Shajib Ghosh, Nitin Varshney, Reza Forghani, Navid Asadizanjani, Charles Woychik, Antika Roy
article en
2 citations

Abstract

Segmentation of printed circuit board (PCB) components from X-ray images holds paramount significance as it constitutes a crucial step in design extraction and reverse engineering processes. Conventional pretrained deep learning segmentation models demand considerable resources and produce less-than-optimal outcomes and often results in overfitting due to the scarcity of the labeled PCB X-ray data. The Segment Anything Model (SAM), known for its versatility in semantic segmentation tasks, showcases its capability to effectively segment a wide array of objects found in natural images. Nonetheless, it encounters challenges when it comes to the complex design of PCB X-ray images, causing difficulty in accurately segmenting the components present in the circuit boards design. Adapting this foundation model to the unique challenges posed by PCB X-ray images, such as intricate component structures and variations in X-ray artifacts, requires careful modification and optimization. In this study, we propose a customized approach for segmenting components from X-ray images of PCBs that use a modified SAM model with parameter-efficient fine-tuning and few-shot generalization strategies. We introduce modifications to enhance the model’s ability to capture intricate spatial relationships and effectively segment individual components. Our methodology focuses on the efficient adaptation of the foundation model to the unique characteristics of PCB X-ray images, including complex component structures and varying noise conditions. Leveraging few-shot learning techniques, we address the challenge of limited annotated data in the PCB X-ray domain, towards the aim of enabling the model to generalize effectively with minimal fine-tuning. Our work has the potential to pave the way for a novel solution to the challenge of implementing deep learning in a limited dataset by leveraging the capabilities of a foundation model.

University of Florida (US), NHanced Semiconductors (United States) (US)
Openalex Percentile: Top 26%
Industrial Vision Systems and Defect Detection
0.70
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.