InP-based high-performance extended short wavelength p-B-n infrared photodetector with InGaAs/GaAsSb type-II superlattice absorption layer

High-performance p-B-n infrared photodetectors based on In0.53Ga0.47As/Ga0.51As0.49Sb type-II superlattices with an Al0.85Ga0.15AsSb barrier on an InP substrate have been demonstrated. These photodetectors exhibit 50% and 100% cutoff wavelengths of ∼2.1 μm and ∼2.6 μm, respectively. At a bias voltage of −100 mV bias voltage, the device exhibits a peak responsivity of 0.618 A/W at 2.1 μm, corresponding to a quantum efficiency of 36.5%. The device exhibits a saturated dark current shot noise limited specific detectivity (D*) of 4.12 × 1010 cm·Hz1/2/W (at a peak responsivity of 2.1 μm) under −100 mV applied bias at 300 K.

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Publication Details

Journal
Applied Physics Letters
Published
2024-09-30
DOI
https://doi.org/10.1063/5.0223557
Citations
8
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
1.67

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article

InP-based high-performance extended short wavelength p-B-n infrared photodetector with InGaAs/GaAsSb type-II superlattice absorption layer

Yifan Shan, Faran Chang, Chuanbo Li, Yi Shi et al.
8 citations
Applied Physics Letters
Advanced Semiconductor Detectors and Materials
1.67
article

InP-based high-performance extended short wavelength p-B-n infrared photodetector with InGaAs/GaAsSb type-II superlattice absorption layer

Yifan Shan, Faran Chang, Chuanbo Li, Yi Shi, Nong Li, Yingqiang Xu, Ye Zhang, Chengao Yang, Xiangyu Zhang, Hongyue Hao, Fan Ye, Yan Liang, Donghai Wu, Dongwei Jiang, Youdou Zheng, Xiangbin Su, Guo Wei Wang, Zhichuan Niu, Haiqiao Ni, Wenguang Zhou
article en
8 citations

Abstract

High-performance p-B-n infrared photodetectors based on In0.53Ga0.47As/Ga0.51As0.49Sb type-II superlattices with an Al0.85Ga0.15AsSb barrier on an InP substrate have been demonstrated. These photodetectors exhibit 50% and 100% cutoff wavelengths of ∼2.1 μm and ∼2.6 μm, respectively. At a bias voltage of −100 mV bias voltage, the device exhibits a peak responsivity of 0.618 A/W at 2.1 μm, corresponding to a quantum efficiency of 36.5%. The device exhibits a saturated dark current shot noise limited specific detectivity (D*) of 4.12 × 1010 cm·Hz1/2/W (at a peak responsivity of 2.1 μm) under −100 mV applied bias at 300 K.

Applied Physics LettersVol. 125(14)
Minzu University of China (CN), Chinese Academy of Sciences (CN), Harbin Institute of Technology (CN), Institute of Semiconductors (CN), Nanjing University (CN)
Key Technologies Research and Development Program
Openalex Percentile: Top 16%
Advanced Semiconductor Detectors and Materials
1.67
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