Lattice symmetry relaxation as a cause for anisotropic line broadening and peak shift in powder diffraction

In powder diffraction, lattice symmetry relaxation causes a peak to split into several components which are not resolved if the degree of desymmetrization is small (pseudosymmetry). Here the equations which rule peak splitting are elaborated for the six minimal symmetry transitions, showing that the resulting split peaks are generally broader and asymmetric, and suffer an hkl-dependent displacement with respect to the high-symmetry parent peak. These results will be of help in Rietveld refinement of pseudosymmetric structures where an exact interpretation of peak deformation is required.

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Publication Details

Journal
Acta Crystallographica Section A Foundations and Advances
Published
2024-10-03
DOI
https://doi.org/10.1107/s2053273324008799
Citations
2
Primary Topic
X-ray Diffraction in Crystallography
Type
article
Field-Weighted Citation Impact
0.23
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article

Lattice symmetry relaxation as a cause for anisotropic line broadening and peak shift in powder diffraction

Alice Boschetti, M. Gregorkiewitz
2 citations
Acta Crystallographica Section A Foundations and Advances
X-ray Diffraction in Crystallography
0.23
article

Lattice symmetry relaxation as a cause for anisotropic line broadening and peak shift in powder diffraction

Alice Boschetti, M. Gregorkiewitz
article en
2 citations

Abstract

In powder diffraction, lattice symmetry relaxation causes a peak to split into several components which are not resolved if the degree of desymmetrization is small (pseudosymmetry). Here the equations which rule peak splitting are elaborated for the six minimal symmetry transitions, showing that the resulting split peaks are generally broader and asymmetric, and suffer an hkl-dependent displacement with respect to the high-symmetry parent peak. These results will be of help in Rietveld refinement of pseudosymmetric structures where an exact interpretation of peak deformation is required.

Acta Crystallographica Section A Foundations and AdvancesVol. 80(6)
University of Siena (IT)
Openalex Percentile: Top 51%
X-ray Diffraction in Crystallography
0.23
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