Pulse characterization using a temporal knife-edge in ENZ films
We demonstrate a use case for the ENZ region of transparent conducting oxides as a means for compact and phase-matching free pulse characterization for near-infrared beams. We leverage a ‘temporal knife edge’, generated by an off-axis pump to extract the spatial shape and pulse width information of a Gaussian beam using a quadrant cell detector. Operating within the ENZ region enables the use of sub-micron thick films and moderate optical fluences (1-10 GW/cm2) compared to conventional bulk dielectrics or crystals, for compact pulse characterization systems.
Authors
- Nathaniel Kinsey (ORCID: https://orcid.org/0000-0002-3825-5434)
- Adam Ball (ORCID: https://orcid.org/0000-0003-1816-7813)
- Dhruv Fomra (ORCID: https://orcid.org/0000-0002-5555-3142)
- Samprity Saha (ORCID: https://orcid.org/0000-0002-7211-0175)
- Jingwei Wu (ORCID: https://orcid.org/0000-0002-4108-0188)
Institutions
- National Institute of Standards and Technology (US)
- Virginia Commonwealth University (US)
Publication Details
- Published
- 2024-10-02
- DOI
- https://doi.org/10.1117/12.3027517
- Primary Topic
- Acoustic Wave Resonator Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00