A system reliability demonstration test design method based on subsystem test data

Abstract Reliability demonstration test (RDT) is the test to verify that the reliability of the product meets the reliability requirements during product development and is usually required to be performed to determine whether it can be accepted. It is essential for complex systems with higher costs. However, the traditional test plans such as the plan in the current RDT standard GJB‐899A have the problem of too long test time or too high risk. In addition, the test data of the complex system itself is usually less, but the test data of the subsystem is easier to obtain. In this paper, the research object is the system, and the main research content is how to use the reliability growth data in the development stage of the subsystem to design the system RDT. First, based on the reliability growth model, the test data in the development stage of the subsystems are modeled to obtain the reliability of each subsystem. The Bayesian theory is used to obtain the lifetime distribution of the system. Then, according to the definition of the two types of risks in the RDT, the life distribution of the product is integrated into the two types of risks, and the RDT plans of the system are designed. Finally, a simulation case is used to verify our RDT design method, and the results show that compared with the traditional plan, our RDT plan designed has a shorter test time and lower test risk.