Correlations of interface charge accumulation and device characteristics studied by DCM-PL technique

Spontaneous orientation polarization (SOP) results in excess charge accumulation at the interfaces within OLEDs. The excess charge accumulation leads to significant exciton-polaron quenching (EPQ) and correlates to the device degradation. While SOP is observed in various OLED materials, the optimized SOP configuration remains not well understood. In this study, we demonstrated the correlations of the interface charge accumulation and device characteristics, particularly focusing on EPQ and device degradation, by the simultaneous measurement technique of displacement current and photoluminescence intensity (DCM-PL).