Ab initio methods applied to carbon-containing defects in hexagonal boron nitride

The functionalities activated by defect centers in solids are constantly growing, opening new avenues for sustainable future technologies. These may extend to quantum optoelectronics if suitable defect centers are created and their properties understood. Recent progress in developing quantum emitters in hexagonal boron nitride (hBN) associated with carbon impurities enabled the realization of such concepts in atomically thin films, where the defect centers exhibit an unprecedented level of sensitivity toward the environment. The complexity of defects, together with new control knobs provided by van der Waals technology, poses a challenge for theory to accurately predict the properties of defect centers and to match them with experimental results. Here, we review the ab initio methods applied to carbon-containing defect centers in hBN, exploring the predictive capabilities of different levels of theory for their structural and optoelectronic properties.

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Publication Details

Journal
Materials Today Sustainability
Published
2024-09-30
DOI
https://doi.org/10.1016/j.mtsust.2024.100988
Citations
5
Primary Topic
Graphene research and applications
Type
article
Field-Weighted Citation Impact
0.59

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article

Ab initio methods applied to carbon-containing defects in hexagonal boron nitride

Cyrus E. Dreyer, Danis I. Badrtdinov, Malte Rösner, Ao Wu et al.
5 citations
Materials Today Sustainability
Graphene research and applications
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article

Ab initio methods applied to carbon-containing defects in hexagonal boron nitride

Cyrus E. Dreyer, Danis I. Badrtdinov, Malte Rösner, Ao Wu, Maciej Koperski, Woncheol Lee
article en
5 citations

Abstract

The functionalities activated by defect centers in solids are constantly growing, opening new avenues for sustainable future technologies. These may extend to quantum optoelectronics if suitable defect centers are created and their properties understood. Recent progress in developing quantum emitters in hexagonal boron nitride (hBN) associated with carbon impurities enabled the realization of such concepts in atomically thin films, where the defect centers exhibit an unprecedented level of sensitivity toward the environment. The complexity of defects, together with new control knobs provided by van der Waals technology, poses a challenge for theory to accurately predict the properties of defect centers and to match them with experimental results. Here, we review the ab initio methods applied to carbon-containing defect centers in hBN, exploring the predictive capabilities of different levels of theory for their structural and optoelectronic properties.

Materials Today SustainabilityVol. 28
Radboud University Nijmegen (NL), University of California, Santa Barbara (US), National University of Singapore (SG), Flatiron Health (United States) (US), Flatiron Institute (US), Stony Brook University (US)
National Science Foundation, Flatiron Health, Ministry of Education - Singapore, Ministry of Education, India, Office of Naval Research, Division of Materials Research, Air Force Office of Scientific Research, Office of Naval Research Global
Openalex Percentile: Top 33%
Graphene research and applications
0.59
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