Classification of Single‐Photon Emitters in Confocal Fluorescence Microscope Images by Deep Convolutional Neural Networks

Abstract In the rapidly evolving field of quantum information technology, the accurate and efficient classification of single‐photon emitters is paramount. Traditional methods, which rely on conducting time‐intensive Hanbury Brown‐Twiss (HBT) experiments to acquire the 2nd‐order correlation function of photon statistics, are not efficient. This study presents a pioneering solution that employs Deep Convolutional Neural Networks (CNNs) to classify single‐photon emitters in confocal fluorescence microscope images, thereby bypassing the need for laborious HBT experiments. Focusing on the nitrogen‐vacancy centers in diamond, the model is trained using fluorescence images of emitters that have been previously classified through HBT experiments. Applied to unclassified fluorescence images, the model achieves up to 98% accuracy in classification, substantially accelerating the identification process. This advancement not only makes the classification workflow more efficient but also promises wider applicability across various color centers and isolated atomic systems that necessitate imaging for isolation verification. This research signifies a substantial advancement in the application of quantum technologies, leveraging the power of deep learning to optimize the utilization of single‐photon emitters.

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Publication Details

Journal
Advanced Quantum Technologies
Published
2024-09-27
DOI
https://doi.org/10.1002/qute.202400173
Citations
1
Primary Topic
Advanced Fluorescence Microscopy Techniques
Type
article
Field-Weighted Citation Impact
0.66

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article

Classification of Single‐Photon Emitters in Confocal Fluorescence Microscope Images by Deep Convolutional Neural Networks

Seoyoung Paik, Dongbeom Kim, Takeshi Ohshima, Shinobu Onoda et al.
1 citations
Advanced Quantum Technologies
Advanced Fluorescence Microscopy Techniques
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article

Classification of Single‐Photon Emitters in Confocal Fluorescence Microscope Images by Deep Convolutional Neural Networks

Seoyoung Paik, Dongbeom Kim, Takeshi Ohshima, Shinobu Onoda, Jeongeun Park, Sang‐Yun Lee, Seung‐Jae Hwang
article en
1 citations

Abstract

Abstract In the rapidly evolving field of quantum information technology, the accurate and efficient classification of single‐photon emitters is paramount. Traditional methods, which rely on conducting time‐intensive Hanbury Brown‐Twiss (HBT) experiments to acquire the 2nd‐order correlation function of photon statistics, are not efficient. This study presents a pioneering solution that employs Deep Convolutional Neural Networks (CNNs) to classify single‐photon emitters in confocal fluorescence microscope images, thereby bypassing the need for laborious HBT experiments. Focusing on the nitrogen‐vacancy centers in diamond, the model is trained using fluorescence images of emitters that have been previously classified through HBT experiments. Applied to unclassified fluorescence images, the model achieves up to 98% accuracy in classification, substantially accelerating the identification process. This advancement not only makes the classification workflow more efficient but also promises wider applicability across various color centers and isolated atomic systems that necessitate imaging for isolation verification. This research signifies a substantial advancement in the application of quantum technologies, leveraging the power of deep learning to optimize the utilization of single‐photon emitters.

Advanced Quantum TechnologiesVol. 7(11)
Gwangju Institute of Science and Technology (KR), National Institutes for Quantum Science and Technology (JP)
National Research Foundation, Ministry of Education, Culture, Sports, Science and Technology, National Research Foundation of Korea, Ministry of Science and ICT, South Korea, Japan Society for the Promotion of Science, Japan Science and Technology Agency, Institute for Information and Communications Technology Promotion, Moonshot Research and Development Program
Openalex Percentile: Top 19%
Advanced Fluorescence Microscopy Techniques
0.66
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