Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules

ABSTRACT Potential‐induced degradation (PID) is a prevalent concern in current commercial photovoltaic technologies, impacting their reliability, with the mechanistic basis for PID in perovskite photovoltaic technologies being poorly understood. Here, we investigate the PID mechanism in perovskite minimodules. Our findings reveal nonuniform degradation in the photoluminescence intensity and spectral blue shift. After 60‐h laboratory PID stress tests at −1500 V and 60°C, device efficiency drastically decreases by 96%, and the shunt resistance decreases by 97%, accompanied by a significant quantity of Na + ions (derived from the soda lime glass) throughout the device structure, leading to a typical PID‐shunting effect. Interestingly, we observed a rapid recovery of device performance during room‐temperature dark storage, in which Na + ions located close to the glass substrate side rapidly migrated out of the device. Moreover, we also found that the Na + ions do not appear to diffuse through the grain boundaries but rather their neighboring area and grain interiors, judging by microscopic conductivity mappings.

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Publication Details

Journal
Progress in Photovoltaics Research and Applications
Published
2024-09-27
DOI
https://doi.org/10.1002/pip.3848
Citations
7
Primary Topic
Perovskite Materials and Applications
Type
article
Field-Weighted Citation Impact
1.46

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article

Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules

Chuanxiao Xiao, Junchuan Zhang, Abdullah M. Asiri, Mohammad Khaja Nazeeruddin et al.
7 citations
Progress in Photovoltaics Research and Applications
Perovskite Materials and Applications
1.46
article

Investigation of Potential‐Induced Degradation and Recovery in Perovskite Minimodules

Chuanxiao Xiao, Junchuan Zhang, Abdullah M. Asiri, Mohammad Khaja Nazeeruddin, Jichun Ye, Yi Zhang, Minghui Li, Zhiheng Qiu, Xiting Lang, Haodong Wu, Xirui Liu, Fangfang Cao, Yongjie Jiang, Paul J. Dyson, Yangyang Gou
article en
7 citations

Abstract

ABSTRACT Potential‐induced degradation (PID) is a prevalent concern in current commercial photovoltaic technologies, impacting their reliability, with the mechanistic basis for PID in perovskite photovoltaic technologies being poorly understood. Here, we investigate the PID mechanism in perovskite minimodules. Our findings reveal nonuniform degradation in the photoluminescence intensity and spectral blue shift. After 60‐h laboratory PID stress tests at −1500 V and 60°C, device efficiency drastically decreases by 96%, and the shunt resistance decreases by 97%, accompanied by a significant quantity of Na + ions (derived from the soda lime glass) throughout the device structure, leading to a typical PID‐shunting effect. Interestingly, we observed a rapid recovery of device performance during room‐temperature dark storage, in which Na + ions located close to the glass substrate side rapidly migrated out of the device. Moreover, we also found that the Na + ions do not appear to diffuse through the grain boundaries but rather their neighboring area and grain interiors, judging by microscopic conductivity mappings.

Progress in Photovoltaics Research and ApplicationsVol. 32(12)
Ningbo University (CN), University of Science and Technology of China (CN), University of Nottingham Ningbo China (CN), King Abdulaziz University (SA), Chinese Academy of Sciences (CN), Wuhan Engineering Science & Technology Institute (CN), Ningbo Institute of Industrial Technology (CN), École Polytechnique Fédérale de Lausanne (CH)
National Natural Science Foundation of China
Openalex Percentile: Top 18%
Perovskite Materials and Applications
1.46
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