(Invited) Selective Wet Etching of Semiconductor Materials by Novel Catalyst-assisted Modes

Since reports in the mid-1990s on metal-induced pitting on a Si surface in microelectronics, much attention has been paid to the positive use of corrosion of a semiconductor surface loaded with a metallic catalyst in solutions, known as metal-assisted chemical etching. This paper describes two novel modes of catalyst-assisted etching. The first involves the formation of nano trenches along the atomic step edges of a Si(111) surface with the help of self-assembled metallic nanowires, enabling the separation of neighboring terraces. The second discusses the science and application of nanocarbon-assisted etching, free from noble metals, of a Ge surface in water.

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Publication Details

Journal
ECS Transactions
Published
2024-09-27
DOI
https://doi.org/10.1149/11401.0017ecst
Primary Topic
Copper Interconnects and Reliability
Type
article
Field-Weighted Citation Impact
0.00
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article

(Invited) Selective Wet Etching of Semiconductor Materials by Novel Catalyst-assisted Modes

Junhuan Li, Kouji Inagaki, Kenta Arima, Shiika Murase
ECS Transactions
Copper Interconnects and Reliability
article

(Invited) Selective Wet Etching of Semiconductor Materials by Novel Catalyst-assisted Modes

Junhuan Li, Kouji Inagaki, Kenta Arima, Shiika Murase
article en

Abstract

Since reports in the mid-1990s on metal-induced pitting on a Si surface in microelectronics, much attention has been paid to the positive use of corrosion of a semiconductor surface loaded with a metallic catalyst in solutions, known as metal-assisted chemical etching. This paper describes two novel modes of catalyst-assisted etching. The first involves the formation of nano trenches along the atomic step edges of a Si(111) surface with the help of self-assembled metallic nanowires, enabling the separation of neighboring terraces. The second discusses the science and application of nanocarbon-assisted etching, free from noble metals, of a Ge surface in water.

ECS TransactionsVol. 114(1)
Openalex Percentile: Top 91%
Copper Interconnects and Reliability
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