Oxygen Vacancy Compensation-Induced Analog Resistive Switching in the SrFeO<sub>3−δ</sub>/Nb:SrTiO<sub>3</sub> Epitaxial Heterojunction for Noise-Tolerant High-Precision Image Recognition

Neuromorphic computing, inspired by the brain's architecture, promises to surpass the limitations of von Neumann computing. In this paradigm, synaptic devices play a crucial role, with resistive switching memory (memristors) emerging as promising candidates due to their low power consumption and scalability advantages. This study focuses on the development of metal/oxide-semiconductor heterojunctions, which offer several technological advantages and have broad potential for applications in artificial neural synapses. However, constructing high-quality epitaxial interfaces between metal and oxide semiconductors and designing modifiable contact barriers are challenging. Herein, we construct high-quality epitaxial metal/semiconductor interfaces based on the metallicity of the perovskite phase SrFeO<sub>3-δ</sub> (PV-SFO) and a small Schottky barrier in contact with Nb-doped SrTiO<sub>3</sub> (NSTO). X-ray diffraction patterns, reciprocal space mapping results, and cross-sectional transmission electron microscopy images reveal that the prepared PV-SFO film exhibits a perfect single-crystal structure and an excellent epitaxial interface with the NSTO (111) substrate. The corresponding memristor exhibits analog-type resistive-variable characteristics with an ON/OFF ratio of ∼1000, stable data retention after 10,000 s, and no noticeable fluctuation in resistance after 10,000 pulse cycles. Electron energy loss spectroscopy, first-principles calculations, and electrical measurements reveal that compensating or restoring oxygen vacancies at the NSTO surface decreases or increases the contact barrier between PV-SFO and NSTO, respectively, thereby gradually regulating the resistance value. Furthermore, high-quality epitaxial PV-SFO/NSTO devices achieve up to 98.21% recognition accuracy for handwriting recognition tasks using LeNet-5-based network structures and 92.21% accuracy for color images using visual geometry group (VGG) network structures. This work contributes to the advancement of interface-type memristors and provides valuable insights into enhancing synaptic functionality in neuromorphic computing systems.

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Publication Details

Journal
ACS Applied Materials & Interfaces
Published
2024-09-27
DOI
https://doi.org/10.1021/acsami.4c07951
Citations
10
Primary Topic
Advanced Memory and Neural Computing
Type
article
Field-Weighted Citation Impact
2.09

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article

Oxygen Vacancy Compensation-Induced Analog Resistive Switching in the SrFeO3−δ/Nb:SrTiO3 Epitaxial Heterojunction for Noise-Tolerant High-Precision Image Recognition

Ruizi Xiao, P. T. Lai, Xiangshui Miao, Hongyu An et al.
10 citations
ACS Applied Materials & Interfaces
Advanced Memory and Neural Computing
2.09
article

Oxygen Vacancy Compensation-Induced Analog Resistive Switching in the SrFeO3−δ/Nb:SrTiO3 Epitaxial Heterojunction for Noise-Tolerant High-Precision Image Recognition

Ruizi Xiao, P. T. Lai, Xiangshui Miao, Hongyu An, D. C. Chen, Weiming Cheng, Lei Ye, Yi Li, Rui Su, Duan Yu-feng, Yu Heng Deng, Jingping Xu
article en
10 citations

Abstract

Neuromorphic computing, inspired by the brain's architecture, promises to surpass the limitations of von Neumann computing. In this paradigm, synaptic devices play a crucial role, with resistive switching memory (memristors) emerging as promising candidates due to their low power consumption and scalability advantages. This study focuses on the development of metal/oxide-semiconductor heterojunctions, which offer several technological advantages and have broad potential for applications in artificial neural synapses. However, constructing high-quality epitaxial interfaces between metal and oxide semiconductors and designing modifiable contact barriers are challenging. Herein, we construct high-quality epitaxial metal/semiconductor interfaces based on the metallicity of the perovskite phase SrFeO<sub>3-δ</sub> (PV-SFO) and a small Schottky barrier in contact with Nb-doped SrTiO<sub>3</sub> (NSTO). X-ray diffraction patterns, reciprocal space mapping results, and cross-sectional transmission electron microscopy images reveal that the prepared PV-SFO film exhibits a perfect single-crystal structure and an excellent epitaxial interface with the NSTO (111) substrate. The corresponding memristor exhibits analog-type resistive-variable characteristics with an ON/OFF ratio of ∼1000, stable data retention after 10,000 s, and no noticeable fluctuation in resistance after 10,000 pulse cycles. Electron energy loss spectroscopy, first-principles calculations, and electrical measurements reveal that compensating or restoring oxygen vacancies at the NSTO surface decreases or increases the contact barrier between PV-SFO and NSTO, respectively, thereby gradually regulating the resistance value. Furthermore, high-quality epitaxial PV-SFO/NSTO devices achieve up to 98.21% recognition accuracy for handwriting recognition tasks using LeNet-5-based network structures and 92.21% accuracy for color images using visual geometry group (VGG) network structures. This work contributes to the advancement of interface-type memristors and provides valuable insights into enhancing synaptic functionality in neuromorphic computing systems.

ACS Applied Materials & InterfacesVol. 16(40)
Shenzhen Technology University (CN), Huazhong University of Science and Technology (CN), University of Hong Kong (HK)
National Natural Science Foundation of China, Research Grants Council, University Grants Committee, National Key Research and Development Program of China, Fundamental Research Funds for the Central Universities
Openalex Percentile: Top 12%
Advanced Memory and Neural Computing
2.09
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