The research on machine-vision-based EMI source localization technology for DCDC converter circuit boards

This paper proposes a method for EMI source localization on DCDC converter circuit boards based on machine vision. By analyzing the operating principle of DCDC converters and the mechanism of EMI generation, the application of vision technology in EMI source localization is discussed. A complete system including hardware platform construction, image processing, and EMI source localization algorithms is designed. Simulations and experiments show that this method can effectively identify and locate the EMI source with high precision and real-time performance. There is a good correspondence between the magnetic field distribution images and the EMI source locations. This paper provides new ideas and methods for the diagnosis and resolution of EMI issues.

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Publication Details

Published
2024-09-27
DOI
https://doi.org/10.1117/12.3037693
Citations
1
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.21
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article

The research on machine-vision-based EMI source localization technology for DCDC converter circuit boards

Hongzhi Feng
1 citations
Integrated Circuits and Semiconductor Failure Analysis
0.21
article

The research on machine-vision-based EMI source localization technology for DCDC converter circuit boards

Hongzhi Feng
article en
1 citations

Abstract

This paper proposes a method for EMI source localization on DCDC converter circuit boards based on machine vision. By analyzing the operating principle of DCDC converters and the mechanism of EMI generation, the application of vision technology in EMI source localization is discussed. A complete system including hardware platform construction, image processing, and EMI source localization algorithms is designed. Simulations and experiments show that this method can effectively identify and locate the EMI source with high precision and real-time performance. There is a good correspondence between the magnetic field distribution images and the EMI source locations. This paper provides new ideas and methods for the diagnosis and resolution of EMI issues.

China Mobile (China) (CN)
Affordable and clean energy
Openalex Percentile: Top 48%
Integrated Circuits and Semiconductor Failure Analysis
0.21
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