Aluminum relaxation as the source of excess low energy events in low threshold calorimeters

A previously unexplained background called the Low Energy Excess has negatively impacted the reach of a variety of low threshold calorimeters including light dark matter direct detection and coherent elastic neutrino-nucleus scattering experiments. The relaxation of stressed aluminum films as mediated by the motion of dislocations may account for these observations.

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Publication Details

Journal
Journal of Applied Physics
Published
2024-09-26
DOI
https://doi.org/10.1063/5.0222654
Citations
9
Primary Topic
Superconducting and THz Device Technology
Type
article
Field-Weighted Citation Impact
2.98

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article

Aluminum relaxation as the source of excess low energy events in low threshold calorimeters

R. K. Romani
9 citations
Journal of Applied Physics
Superconducting and THz Device Technology
2.98
article

Aluminum relaxation as the source of excess low energy events in low threshold calorimeters

R. K. Romani
article en
9 citations

Abstract

A previously unexplained background called the Low Energy Excess has negatively impacted the reach of a variety of low threshold calorimeters including light dark matter direct detection and coherent elastic neutrino-nucleus scattering experiments. The relaxation of stressed aluminum films as mediated by the motion of dislocations may account for these observations.

Journal of Applied PhysicsVol. 136(12)
University of California, Berkeley (US)
U.S. Department of Energy, Government of Canada, Institut Périmètre de physique théorique, Ministry of Colleges and Universities, Lawrence Berkeley National Laboratory
Affordable and clean energy
Openalex Percentile: Top 9%
Superconducting and THz Device Technology
2.98
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