Selecting a target for obtaining films of higher manganese silicide using magnetron sputtering

A film of manganese silicides on mica was obtained using a magnetron sputter from three types of targets. Microstructure and elemental composition of targets and films studied by scanning electron microscopy and electron reflection diffraction methods. The phase composition and texture of films by thickness (cross sections) were controlled by scanning and transmission electron microscopy. It has been shown that when depositing films from a poly- and single-crystalline target of higher manganese silicide, in contrast to a target of sintered Mn and Si powders, after successive annealing at a temperature of 800 K and a temperature of 10–3 Pa for 1 hour, polycrystalline films of higher silicide can be obtained. manganese composition Mn4Si7.

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Publication Details

Journal
Кристаллография
Published
2024-09-05
DOI
https://doi.org/10.31857/s0023476124030144
Primary Topic
Semiconductor materials and interfaces
Type
article
Field-Weighted Citation Impact
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article

Selecting a target for obtaining films of higher manganese silicide using magnetron sputtering

T. S. Kamilov, V. V. Klechkovskaya, Anton S. Orekhov, М. S. Lukasov et al.
Кристаллография
Semiconductor materials and interfaces
article

Selecting a target for obtaining films of higher manganese silicide using magnetron sputtering

T. S. Kamilov, V. V. Klechkovskaya, Anton S. Orekhov, М. S. Lukasov, Н. А. Архарова
article en

Abstract

A film of manganese silicides on mica was obtained using a magnetron sputter from three types of targets. Microstructure and elemental composition of targets and films studied by scanning electron microscopy and electron reflection diffraction methods. The phase composition and texture of films by thickness (cross sections) were controlled by scanning and transmission electron microscopy. It has been shown that when depositing films from a poly- and single-crystalline target of higher manganese silicide, in contrast to a target of sintered Mn and Si powders, after successive annealing at a temperature of 800 K and a temperature of 10–3 Pa for 1 hour, polycrystalline films of higher silicide can be obtained. manganese composition Mn4Si7.

КристаллографияVol. 69(3)
Kurchatov Institute (RU), Tashkent State Technical University named after Islam Karimov (UZ), Institute of Crystallography (IT)
Openalex Percentile: Top 86%
Semiconductor materials and interfaces
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