SAT-based Formal Verification of Fault Injection Countermeasures for Cryptographic Circuits
Fault injection attacks represent a type of active, physical attack against cryptographic circuits. Various countermeasures have been proposed to thwart such attacks, however, the design and implementation of which are intricate, error-prone, and laborious. The current formal fault-resistance verification approaches are limited in efficiency and scalability. In this paper, we formalize the fault-resistance verification problem and show that it is coNP-complete. We then devise a novel approach for encoding the fault-resistance verification problem as the Boolean satisfiability (SAT) problem so that modern off-the-shelf SAT solvers can be utilized. The approach is implemented in an open-source tool FIRMER which is evaluated extensively on realistic cryptographic circuit benchmarks. The experimental results show that FIRMER is able to verify fault-resistance of almost all (72/76) benchmarks in 3 minutes (the other three are verified in 35 minutes and the hardest one is verified in 4 hours). In contrast, the prior approach fails on 31 fault-resistance verification tasks even after 24 hours (per task).
Authors
- Zhilin Wu
- Fu Song (ORCID: https://orcid.org/0000-0002-0581-2679)
- Taolue Chen (ORCID: https://orcid.org/0000-0002-5993-1665)
- Pengfei Gao (ORCID: https://orcid.org/0000-0002-8093-5062)
- Huiyu Tan
Institutions
- Beijing Dance Academy (CN)
- ShanghaiTech University (CN)
- Institute of Software (CN)
- Birkbeck, University of London (GB)
Publication Details
- Journal
- IACR Transactions on Cryptographic Hardware and Embedded Systems
- Published
- 2024-09-05
- DOI
- https://doi.org/10.46586/tches.v2024.i4.1-39
- Citations
- 1
- Primary Topic
- Physical Unclonable Functions (PUFs) and Hardware Security
- Type
- article
- Field-Weighted Citation Impact
- 0.49
Funders
- National Natural Science Foundation of China
- Nanjing University
- State Key Laboratory of Novel Software Technology