Development of high energy resolution crystal analyzers based on microporous ceramics for resonant inelastic x‐ray scattering program at High Energy Photon Source
Abstract The spherically bent x‐ray crystal analyzer is one of the key optical elements for performing high energy resolution hard x‐ray spectroscopies based on Rowland circle geometry. To meet the requirements of Resonant Inelastic X‐ray Scattering (RIXS) program at High Energy Photon Source (HEPS), the fourth‐generation high energy synchrotron in Beijing, China, high energy resolution crystal analyzers were fabricated. The fabrication processes of vacuum‐mounted flat‐diced crystal analyzers using home‐designed devices with microporous ceramics are presented. The energy resolution of the vacuum‐mounted crystal analyzers, for measuring Cu K ‐edge RIXS, is benchmarked with that of the glued flat‐diced crystal analyzers. Both the gluing and vacuum‐mounting are proven to be reliable techniques for the routine production of spherical bent diced crystal analyzers with energy resolution of tens of meV, and with good focal properties and efficiency. In particular, the vacuum‐mounted technique will be beneficial for the RIXS techniques to target multiple elements of interest.
Authors
- Shuoxue Jin (ORCID: https://orcid.org/0000-0002-7195-6259)
- Xiaolong Gan (ORCID: https://orcid.org/0000-0002-0856-1908)
- Kenji Ishii (ORCID: https://orcid.org/0000-0002-6465-8202)
- Ye Tian (ORCID: https://orcid.org/0000-0002-5618-5951)
- Qianshun Diao
- Q. Han (ORCID: https://orcid.org/0000-0002-6904-0233)
- Zhiying Guo (ORCID: https://orcid.org/0000-0001-5904-3409)
- Han Zhang (ORCID: https://orcid.org/0000-0001-9352-5401)
- Yujun Zhang (ORCID: https://orcid.org/0000-0003-4892-1100)
- Haijie Qian
- Wei Xu (ORCID: https://orcid.org/0009-0003-1953-1872)
- Xun Jia (ORCID: https://orcid.org/0000-0002-3446-4570)
Institutions
- Chinese Academy of Sciences (CN)
- National Institutes for Quantum Science and Technology (JP)
- Institute of High Energy Physics (CN)
- University of Chinese Academy of Sciences (CN)
Publication Details
- Journal
- X-Ray Spectrometry
- Published
- 2024-09-16
- DOI
- https://doi.org/10.1002/xrs.3453
- Citations
- 1
- Primary Topic
- X-ray Diffraction in Crystallography
- Type
- article
- Field-Weighted Citation Impact
- 0.12
Funders
- National Key Research and Development Program of China
- High Energy Photon Source