Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy

Abstract Carbides, especially transition metal carbides (TMCs) and non‐metallic silicon carbides (SiCs), have registered wide applications in catalysis, superconductivity, semiconductor, and the like. Systematic studies have demonstrated the essential role of carbon in finetuning the atomic structures and electronic properties of carbides to improve their catalytic performance, superconducting transition temperature, and semiconductor bandgap. These advancements have positioned carbides as efficient substitutes for noble metals and crucial components in technological innovations. Scanning tunneling microscopy (STM) has emerged as a powerful technique in these studies, providing high‐resolution visualization and mapping of the surface geometric and electronic structures of these functionalized carbides. This review mainly focuses on the key aspects like the structures and properties of the aforementioned TMC and SiC surfaces unraveled by STM, aiming at understanding the fundamentals behind the state‐of‐the‐art technologies and advanced applications of the carbide‐involved functional systems. A very brief perspective on this topic is also provided at the end.

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Publication Details

Journal
Advanced Materials Interfaces
Published
2024-09-16
DOI
https://doi.org/10.1002/admi.202400276
Citations
2
Primary Topic
Advanced Materials Characterization Techniques
Type
article
Field-Weighted Citation Impact
0.37

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article

Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy

Xiong Zhou, Kai Wu, Weijun Guo, Haoran Chen et al.
2 citations
Advanced Materials Interfaces
Advanced Materials Characterization Techniques
0.37
article

Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy

Xiong Zhou, Kai Wu, Weijun Guo, Haoran Chen, Changlin Li
article en
2 citations

Abstract

Abstract Carbides, especially transition metal carbides (TMCs) and non‐metallic silicon carbides (SiCs), have registered wide applications in catalysis, superconductivity, semiconductor, and the like. Systematic studies have demonstrated the essential role of carbon in finetuning the atomic structures and electronic properties of carbides to improve their catalytic performance, superconducting transition temperature, and semiconductor bandgap. These advancements have positioned carbides as efficient substitutes for noble metals and crucial components in technological innovations. Scanning tunneling microscopy (STM) has emerged as a powerful technique in these studies, providing high‐resolution visualization and mapping of the surface geometric and electronic structures of these functionalized carbides. This review mainly focuses on the key aspects like the structures and properties of the aforementioned TMC and SiC surfaces unraveled by STM, aiming at understanding the fundamentals behind the state‐of‐the‐art technologies and advanced applications of the carbide‐involved functional systems. A very brief perspective on this topic is also provided at the end.

Advanced Materials InterfacesVol. 12(4)
Peking University (CN), Beijing National Laboratory for Molecular Sciences (CN), Aerospace Research Institute of Materials and Processing Technology (CN)
Innovative Research Group Project of the National Natural Science Foundation of China, National Natural Science Foundation of China
Openalex Percentile: Top 43%
Advanced Materials Characterization Techniques
0.37
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Atomic Structures and Electronic Properties of Carbide Surfaces Unraveled by Scanning Tunneling Microscopy — Xiong Zhou, Kai Wu, et al. · Advanced Materials Interfaces (2024) | TGRS Research Map | TGRS