Determining the oxidation stability of SnSe under atmospheric exposure
Abstract Understanding surface stability becomes critical as 2D materials like SnSe are developed for piezoelectric and optical applications. SnSe thin films deposited by molecular beam epitaxy showed no structural changes after a two-year exposure to atmosphere, as confirmed by X-ray diffraction and Raman spectroscopy. X-ray photoelectron spectroscopy and reflectivity show a stable 3.5 nm surface oxide layer, indicating a self-arresting oxidative process. Resistivity measurements show an electrical response dominated by SnSe post-exposure. This work shows that SnSe films can be used in ambient conditions with minimal risk of long-term degradation, which is critical for the development of piezoelectric or photovoltaic devices. Graphical Abstract
Authors
- Marshall B. Frye (ORCID: https://orcid.org/0000-0002-7858-251X)
- B. Gardner (ORCID: https://orcid.org/0000-0003-1078-2619)
- Matthew Todd McDowell (ORCID: https://orcid.org/0000-0001-5552-3456)
- Jeffrey R. Shallenberger (ORCID: https://orcid.org/0000-0003-2590-1393)
- Derrick S-H. Liu
- Stephanie Law (ORCID: https://orcid.org/0000-0002-5087-6663)
- Lauren M. Garten (ORCID: https://orcid.org/0000-0002-9482-227X)
- Maria Hilse (ORCID: https://orcid.org/0000-0002-2824-1549)
- J Chin (ORCID: https://orcid.org/0000-0002-7320-5678)
- Sebastian A. Marini
Institutions
- Georgia Institute of Technology (US)
- Pennsylvania State University (US)
- Cornell University (US)
Publication Details
- Journal
- MRS Communications
- Published
- 2024-09-19
- DOI
- https://doi.org/10.1557/s43579-024-00630-8
- Citations
- 5
- Primary Topic
- 2D Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.59
Funders
- National Science Foundation
- Pennsylvania State University
- Office of Science
- Office of Naval Research
- Division of Materials Research
- Division of Electrical, Communications and Cyber Systems
- Air Force Office of Scientific Research
- Office of Naval Research Global