Experimental Design of Steel Surface Defect Detection Based on MSFE-YOLO—An Improved YOLOV5 Algorithm with Multi-Scale Feature Extraction
Integrating artificial intelligence (AI) technology into student training programs is strategically crucial for developing future professionals with both forward-thinking capabilities and practical skills. This paper uses steel surface defect detection as a case study to propose a simulation-based teaching method grounded in deep learning. The method encompasses the entire process from data preprocessing and model training to validation analysis and innovation optimization with the goal of deepening students’ understanding of AI technology and enhancing their ability to apply it to real-world scenarios. We have designed an experimental framework that incorporates the Efficient Multi-Scale Attention (EMA) mechanism into the Backbone network. This approach helps students understand the principles of feature extraction and the core functions of attention mechanisms. Additionally, we introduced a novel architecture—Convolution 3 Dilated Convolution X (C3DX)—into the Neck network. This architecture effectively expands the network’s receptive field, improves its ability to capture multi-scale information, and thus enhances defect detection accuracy. Furthermore, the implementation of the Efficient Intersection over Union (EIoU) loss function optimizes the bounding box predictions, further increasing the model’s accuracy and robustness. Overall, the teaching design not only ensures that the content remains at the cutting edge of technology but also emphasizes its practicality and operability. This approach enables students to effectively apply theoretical knowledge to real-world engineering projects.
Authors
- Yongzhong Zhang
- Hao Zhou (ORCID: https://orcid.org/0000-0002-5671-5334)
- R. Y. Zhang
- Lin Li (ORCID: https://orcid.org/0000-0002-4570-0102)
- Yushan He
- Tunjun Xie
Institutions
- Central South University of Forestry and Technology (CN)
- Central South University (CN)
Publication Details
- Journal
- Electronics
- Published
- 2024-09-23
- DOI
- https://doi.org/10.3390/electronics13183783
- Citations
- 12
- Primary Topic
- Industrial Vision Systems and Defect Detection
- Type
- article
- Field-Weighted Citation Impact
- 4.19
Funders
- National Natural Science Foundation of China