Identification of Missing Gate Faults in Reversible Circuits by a Unity Method

Reversible computing offers a remarkable capability of minimizing heat dissipation in computing systems. The primary advantage lies in its potential to mitigate heat dissipation in computing machinery. This paper describes an approach for recognizing missing gate faults (MGFs) in reversible circuits. The approach that has been put forward utilizes the unity method to effectively identify all types of MGFs—single, multiple, partial, and repeated gate faults. In this work, the unity method generates the single test pattern at the initial level of the circuit using a backtracking process that undergoes generation and conversion of the unity test pattern to an augmented test pattern, which is further reconstructed. A generated test pattern is crucial for pinpointing respective faults, resulting in a significant reduction in computational overhead. Through experimentation on several reversible benchmark circuits, we validate the efficacy of our approach and also provide a correlative evaluation of the existing work.