10 Gbps Data-dependent Jitter Measurement Circuit for Authentication Over Lossy Wireline Channels
This paper presents a relative jitter measurement circuit for use in wireline authentication receivers. Design considerations and trade-offs are discussed for a 10 Gbps realization in a 28nm CMOS process. The results show high accuracy jitter measurements over different channel profiles, with the errors less than 1.25% of the bit period. Simulated power consumption indicates minimal overhead to adding the proposed jitter measurement circuit for authentication in a wireline receiver.
Authors
- Tawfiq Musah (ORCID: https://orcid.org/0000-0002-6703-9490)
- Sydney Lang
Institutions
- The Ohio State University (US)
Publication Details
- Published
- 2024-08-11
- DOI
- https://doi.org/10.1109/mwscas60917.2024.10658739
- Citations
- 1
- Primary Topic
- Advancements in PLL and VCO Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.21