10 Gbps Data-dependent Jitter Measurement Circuit for Authentication Over Lossy Wireline Channels

This paper presents a relative jitter measurement circuit for use in wireline authentication receivers. Design considerations and trade-offs are discussed for a 10 Gbps realization in a 28nm CMOS process. The results show high accuracy jitter measurements over different channel profiles, with the errors less than 1.25% of the bit period. Simulated power consumption indicates minimal overhead to adding the proposed jitter measurement circuit for authentication in a wireline receiver.

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Publication Details

Published
2024-08-11
DOI
https://doi.org/10.1109/mwscas60917.2024.10658739
Citations
1
Primary Topic
Advancements in PLL and VCO Technologies
Type
article
Field-Weighted Citation Impact
0.21
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article

10 Gbps Data-dependent Jitter Measurement Circuit for Authentication Over Lossy Wireline Channels

Tawfiq Musah, Sydney Lang
1 citations
Advancements in PLL and VCO Technologies
0.21
article

10 Gbps Data-dependent Jitter Measurement Circuit for Authentication Over Lossy Wireline Channels

Tawfiq Musah, Sydney Lang
article en
1 citations

Abstract

This paper presents a relative jitter measurement circuit for use in wireline authentication receivers. Design considerations and trade-offs are discussed for a 10 Gbps realization in a 28nm CMOS process. The results show high accuracy jitter measurements over different channel profiles, with the errors less than 1.25% of the bit period. Simulated power consumption indicates minimal overhead to adding the proposed jitter measurement circuit for authentication in a wireline receiver.

The Ohio State University (US)
Openalex Percentile: Top 48%
Advancements in PLL and VCO Technologies
0.21
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10 Gbps Data-dependent Jitter Measurement Circuit for Authentication Over Lossy Wireline Channels — Tawfiq Musah, Sydney Lang · (2024) | TGRS Research Map | TGRS