Phase Noise Measurement with Delay Interferometer During Fast Polarization Fluctuation
Optical phase noise measurement with a delay interferometer is influenced by polarization fluctuation of signal light. We report that we have succeeded in removing the influence by using statistical characteristics of the phase noise. © 2024 The Author(s)
Authors
- Shiro Ryu (ORCID: https://orcid.org/0000-0002-6783-9770)
Institutions
- Meiji University (JP)
Publication Details
- Published
- 2024-08-04
- DOI
- https://doi.org/10.1109/cleo-pr60912.2024.10676923
- Primary Topic
- Quantum optics and atomic interactions
- Type
- article
- Field-Weighted Citation Impact
- 0.00