Probing Physical Parameters of Low-Dimensional Semiconductor Devices by Analytical Photoresponse Theory
Minority carrier recombination lifetimes are difficult to characterize, in particular in low-dimensional semiconductor devices. In this work, we probe the minority recombination lifetimes in silicon nanowires by our recently established analytical photoresponse theory. ©2024 Kai Li Yaping Dan.
Authors
- Yaping Dan (ORCID: https://orcid.org/0000-0002-2983-7213)
- Kai Li (ORCID: https://orcid.org/0000-0001-7609-5454)
Institutions
- Shanghai Jiao Tong University (CN)
Publication Details
- Published
- 2024-08-04
- DOI
- https://doi.org/10.1109/cleo-pr60912.2024.10676428
- Primary Topic
- Advanced Semiconductor Detectors and Materials
- Type
- article
- Field-Weighted Citation Impact
- 0.00