Utilizing the Short-Pulsed Laser on Integrated Circuits to Induce Single-Event Transient Phenomena
An in-house optical setup, utilizing 800 nm or 1060 nm short-pulse lasers, is used to investigate the integrated circuits for the induced single-event transient phenomena, which are important for the space-suited electronic components. © 2024 The Authors
Authors
- Jia‐Han Li (ORCID: https://orcid.org/0000-0003-4348-7552)
- Hsin‐Shu Chen (ORCID: https://orcid.org/0000-0002-7666-4984)
- Chun-Hao Liang (ORCID: https://orcid.org/0000-0003-1746-7515)
- Chien-Ping Hung
Institutions
- National Taiwan University (TW)
Publication Details
- Published
- 2024-08-04
- DOI
- https://doi.org/10.1109/cleo-pr60912.2024.10676936
- Primary Topic
- Radiation Effects in Electronics
- Type
- article
- Field-Weighted Citation Impact
- 0.00