A Noncontact Open-Circuit Fault Detection Method for VSI Systems Using High-Frequency Common-Mode Switching Oscillations
Fault diagnosis is essential for enhancing the reliability of voltage source inverter (VSI) systems. This article proposes a rapid, noncontact method for detecting open-circuit faults (OCFs) in VSI systems. The high-frequency common-mode (HFCM) switching oscillation current is noninvasively captured as a novel indicator. The integrity of the HFCM oscillation signal is utilized to detect and locate the faulty power devices in the VSI system. An HFCM switching oscillation event (SOE)-triggered OCF detection system has been developed, which consists of a high-frequency (HF) switching oscillation sensor, switching event capture circuit, and OCF detection and diagnostic unit. Experimental validation confirms the method’s rapid OCF detection capability within a single switching cycle and its robustness across various operating conditions. Furthermore, this approach enables OCF detection for all six power devices in a VSI system using a single diagnostic variable, i.e., the HFCM switching oscillation current.
Authors
- Hao Li (ORCID: https://orcid.org/0000-0003-0824-6518)
- Xuyao Jiang (ORCID: https://orcid.org/0009-0007-5593-0730)
- Dawei Xiang (ORCID: https://orcid.org/0000-0001-6151-8522)
- Junhao Zhang (ORCID: https://orcid.org/0009-0002-2274-8434)
Institutions
- Tongji University (CN)
- Shanghai University of Electric Power (CN)
Publication Details
- Journal
- IEEE Transactions on Transportation Electrification
- Published
- 2024-09-23
- DOI
- https://doi.org/10.1109/tte.2024.3466398
- Citations
- 3
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.63
Funders
- Shanghai Key Basic Research Program
- National Natural Science Foundation of China
- Key Research and Development Program of Hunan Province of China