In-flight pixel degradation of the Sentinel 5 Precursor TROPOMI-SWIR HgCdTe detector

Abstract The TROPOMI-SWIR HgCdTe detector on the Sentinel-5 Precursor mission has been performing in-orbit measurements of molecular absorption in Earth's atmosphere since its launch in October 2017. In its polar orbit the detector is continuously exposed to potentially harmful energetic particles. Calibration measurements taken during the eclipse are used to inspect the performance of this detector. This paper explores the in-orbit degradation of the HgCdTe detector.
After five years, the detector is still performing within specifications, even though pixels are continuously hit by cosmic radiation. The bulk of the impacts have no lasting effects, and most of the damaged pixels (95%) appear to recover on the order of a few days to several months, attributed to a slow spontaneous recovery of defects in the HgCdTe detector material. This is observed at the operational temperature of 140 K. The distribution of the observed recovery times has a mean around nine days with a significant tail towards several months. Pixels that have degraded have a significant probability to degrade again. The location of faulty pixels follows a Poissonian distribution across the detector. No new clusters have appeared, revealing that impacts are dominated by relatively low energetic protons and electrons. Due to the observed spontaneous recovery of pixels, the fraction of pixels meeting all quality requirements in the nominal operations phase has always been over 98.7%. 
The observed performance of the TROPOMI-SWIR detector in-flight impacts selection criteria of HgCdTe detectors for future space instrumentation.

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Journal
Measurement Science and Technology
Published
2024-09-23
DOI
https://doi.org/10.1088/1361-6501/ad7e3c
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
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article

In-flight pixel degradation of the Sentinel 5 Precursor TROPOMI-SWIR HgCdTe detector

T. A. van Kempen, Ruud W. M. Hoogeveen, Marina Lobanova, Valentina Masarotto et al.
Measurement Science and Technology
Advanced Semiconductor Detectors and Materials
article

In-flight pixel degradation of the Sentinel 5 Precursor TROPOMI-SWIR HgCdTe detector

T. A. van Kempen, Ruud W. M. Hoogeveen, Marina Lobanova, Valentina Masarotto, Solomiia Kurchaba, Richard M. van Hees, Paul Tol
article en

Abstract

Abstract The TROPOMI-SWIR HgCdTe detector on the Sentinel-5 Precursor mission has been performing in-orbit measurements of molecular absorption in Earth's atmosphere since its launch in October 2017. In its polar orbit the detector is continuously exposed to potentially harmful energetic particles. Calibration measurements taken during the eclipse are used to inspect the performance of this detector. This paper explores the in-orbit degradation of the HgCdTe detector.
After five years, the detector is still performing within specifications, even though pixels are continuously hit by cosmic radiation. The bulk of the impacts have no lasting effects, and most of the damaged pixels (95%) appear to recover on the order of a few days to several months, attributed to a slow spontaneous recovery of defects in the HgCdTe detector material. This is observed at the operational temperature of 140 K. The distribution of the observed recovery times has a mean around nine days with a significant tail towards several months. Pixels that have degraded have a significant probability to degrade again. The location of faulty pixels follows a Poissonian distribution across the detector. No new clusters have appeared, revealing that impacts are dominated by relatively low energetic protons and electrons. Due to the observed spontaneous recovery of pixels, the fraction of pixels meeting all quality requirements in the nominal operations phase has always been over 98.7%. 
The observed performance of the TROPOMI-SWIR detector in-flight impacts selection criteria of HgCdTe detectors for future space instrumentation.

Measurement Science and Technology
Leiden University (NL), Space Research Organisation Netherlands (NL), Netherlands Institute for Advanced Study in the Humanities and Social Sciences (NL)
Openalex Percentile: Top 87%
Advanced Semiconductor Detectors and Materials
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