WSe<sub>2</sub>/n-GaN and WSe<sub>2</sub>/p-GaN heterojunction band alignment
Abstract In this work, we measured the band alignment of 2D/3D heterostructures of WSe 2 on n-doped, p-doped, and intrinsic GaN by x-ray photoelectron spectroscopy. The WSe 2 /n-GaN heterojunction exhibits type-II band alignment, with measured valence band offset (VBO) and conduction band offset (CBO) values of 2.28 ± 0.15 eV and 0.96 ± 0.15 eV, respectively. On the other hand, the WSe 2 /p-GaN heterojunction shows type-I band alignment, with measured VBO and CBO values of 0.1 ± 0.15 eV and 1.22 ± 0.15 eV, respectively. The results show that doping has a significant effect on the arrangement of the energy bands of the heterostructure, and provides a reference for device applications based on heterojunctions.
Authors
- Xiurui Lv (ORCID: https://orcid.org/0009-0001-0859-4160)
- Guipeng Liu (ORCID: https://orcid.org/0000-0002-2916-4418)
- X. Liu
- Wanting Wei (ORCID: https://orcid.org/0009-0006-4955-046X)
- Xingliang Wang (ORCID: https://orcid.org/0009-0006-6472-6320)
- Guijuan Zhao (ORCID: https://orcid.org/0000-0002-8496-1612)
Institutions
- Lanzhou University (CN)
- United Microelectronics (United States) (US)
Publication Details
- Journal
- Semiconductor Science and Technology
- Published
- 2024-09-23
- DOI
- https://doi.org/10.1088/1361-6641/ad7d2c
- Citations
- 3
- Primary Topic
- 2D Materials and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.35
Funders
- National Natural Science Foundation of China
- Natural Science Foundation of Gansu Province