Delineation of the impact on temporal behaviors of off-axis photoemission in an ultrafast electron microscope

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges. Recent demonstrations of unconventional off-axis photoemitting geometries are promising, but connections to the observed onset of structural dynamics are yet to be established. Here we use the in-situ photoexcitation of coherent phonons to quantify the relative time-of-flight (r-TOF) of photoelectron packets generated from the Ni Wehnelt aperture and from a Ta cathode set-back from the aperture plane. We further support the UEM experiments with particle-tracing simulations of the precise electron-gun architecture and photoemitting geometries. In this way, we measure discernible shifts in electron-packet TOF of tens of picoseconds for the two photoemitting surfaces. These shifts arise from the impact that the Wehnelt-aperture off-axis orientation has on the electron-momentum distribution, which modifies both the collection efficiency and the temporal-packet distribution relative to on-axis emission. Future needs are identified; we expect this and other developments in UEM electron-gun configuration to expand the range of material phenomena that can be directly imaged on scales commensurate with fundamental structural dynamics.

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Publication Details

Journal
Review of Scientific Instruments
Published
2024-09-01
DOI
https://doi.org/10.1063/5.0222993
Citations
1
Primary Topic
Advanced Electron Microscopy Techniques and Applications
Type
article
Field-Weighted Citation Impact
0.52

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article

Delineation of the impact on temporal behaviors of off-axis photoemission in an ultrafast electron microscope

Simon A. Willis, Jialiang Chen, David J. Flannigan
1 citations
Review of Scientific Instruments
Advanced Electron Microscopy Techniques and Applications
0.52
article

Delineation of the impact on temporal behaviors of off-axis photoemission in an ultrafast electron microscope

Simon A. Willis, Jialiang Chen, David J. Flannigan
article en
1 citations

Abstract

Efforts to push the spatiotemporal imaging-resolution limits of femtosecond laser-driven ultrafast electron microscopes (UEMs) to the combined angstrom-fs range will benefit from stable sources capable of generating high bunch charges. Recent demonstrations of unconventional off-axis photoemitting geometries are promising, but connections to the observed onset of structural dynamics are yet to be established. Here we use the in-situ photoexcitation of coherent phonons to quantify the relative time-of-flight (r-TOF) of photoelectron packets generated from the Ni Wehnelt aperture and from a Ta cathode set-back from the aperture plane. We further support the UEM experiments with particle-tracing simulations of the precise electron-gun architecture and photoemitting geometries. In this way, we measure discernible shifts in electron-packet TOF of tens of picoseconds for the two photoemitting surfaces. These shifts arise from the impact that the Wehnelt-aperture off-axis orientation has on the electron-momentum distribution, which modifies both the collection efficiency and the temporal-packet distribution relative to on-axis emission. Future needs are identified; we expect this and other developments in UEM electron-gun configuration to expand the range of material phenomena that can be directly imaged on scales commensurate with fundamental structural dynamics.

Review of Scientific InstrumentsVol. 95(9)
University of Minnesota (US)
National Science Foundation, U.S. Department of Energy, University of Minnesota, Office of Science, Materials Research Science and Engineering Center, Harvard University, Basic Energy Sciences
Sustainable cities and communities
Openalex Percentile: Top 19%
Advanced Electron Microscopy Techniques and Applications
0.52
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Delineation of the impact on temporal behaviors of off-axis photoemission in an ultrafast electron microscope — Simon A. Willis, Jialiang Chen, et al. · Review of Scientific Instruments (2024) | TGRS Research Map | TGRS