Self-Organizing Maps for Secondary Ion Mass Spectrometry

Secondary ion mass spectrometry (SIMS) is a powerful analytical technique for characterizing the molecular and elemental composition of surfaces. Individual mass spectra can provide information about the mean surface composition, while spatial mapping can elucidate the spatial distributions of molecular species in 2D and 3D with no prior labeling of molecular targets. The data sets produced by SIMS techniques are large and inherently complex, often containing subtle relationships between spatial and molecular features. Machine learning algorithms are well suited to exploring this complexity, making them ideal for data analysis, interpretation, and visualization of SIMS data sets. One such algorithm, the self-organizing map (SOM), is particularly well suited to clustering similar samples and reducing the dimensionality of hyperspectral data sets. Here, we present an introduction to the SOM, a concise mathematical description, and recent examples of its use in SIMS and other related mass spectrometry techniques. These examples demonstrate how SOMs may be used to interpret high volumes of individual mass spectra, imaging, or depth profiling data sets. This review will be useful for specialists in SIMS and other mass spectral techniques seeking to explore self-organizing maps for data analysis.

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Publication Details

Journal
Journal of the American Society for Mass Spectrometry
Published
2024-09-23
DOI
https://doi.org/10.1021/jasms.4c00318
Citations
7
Primary Topic
Ion-surface interactions and analysis
Type
article
Field-Weighted Citation Impact
2.62

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article

Self-Organizing Maps for Secondary Ion Mass Spectrometry

Paul J. Pigram, Damminda Alahakoon, Sarah E. Bamford, Benjamin W. Muir et al.
7 citations
Journal of the American Society for Mass Spectrometry
Ion-surface interactions and analysis
2.62
article

Self-Organizing Maps for Secondary Ion Mass Spectrometry

Paul J. Pigram, Damminda Alahakoon, Sarah E. Bamford, Benjamin W. Muir, Wil Gardner, David A. Winkler
article en
7 citations

Abstract

Secondary ion mass spectrometry (SIMS) is a powerful analytical technique for characterizing the molecular and elemental composition of surfaces. Individual mass spectra can provide information about the mean surface composition, while spatial mapping can elucidate the spatial distributions of molecular species in 2D and 3D with no prior labeling of molecular targets. The data sets produced by SIMS techniques are large and inherently complex, often containing subtle relationships between spatial and molecular features. Machine learning algorithms are well suited to exploring this complexity, making them ideal for data analysis, interpretation, and visualization of SIMS data sets. One such algorithm, the self-organizing map (SOM), is particularly well suited to clustering similar samples and reducing the dimensionality of hyperspectral data sets. Here, we present an introduction to the SOM, a concise mathematical description, and recent examples of its use in SIMS and other related mass spectrometry techniques. These examples demonstrate how SOMs may be used to interpret high volumes of individual mass spectra, imaging, or depth profiling data sets. This review will be useful for specialists in SIMS and other mass spectral techniques seeking to explore self-organizing maps for data analysis.

Journal of the American Society for Mass SpectrometryVol. 35(10)
University of Nottingham (GB), La Trobe University (AU), CSIRO Manufacturing (AU), Monash University (AU)
Australian National Fabrication Facility, Office of National Intelligence
Openalex Percentile: Top 10%
Ion-surface interactions and analysis
2.62
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