Resistive random access memory based on organic-metallic hybrid polymer

Abstract Resistive random access memories (ReRAMs) based on an organic-metallic hybrid polymer, Poly(Fe-btpyb) Purple, were fabricated. This material was synthesized by complexation of metal ion and organic ligand. When applying forward bias, an abrupt resistance change from a low resistance state (LRS) to a high resistance state (HRS), which is known as reset process, was observed. In contrast, a reverse bias switched the resistance from HRS to LRS (set process). The resistive switching phenomenon is probably caused by the electrochemical oxidation-reduction reaction of the metal ion (Fe(II)/Fe(III)). The nonvolatile memory characteristics were measured with data-retention tests, showing no significant degradation over 105 s. The endurance characteristics exhibited sufficient long-term durability, due to no conformational change of the organic ligand. It is proposed that the difference in charge-transfer efficiency between the reduced state (Fe(II)) and oxidized state (Fe(III)) might be the physical mechanism of the resistive switching.

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Publication Details

Journal
Japanese Journal of Applied Physics
Published
2024-09-20
DOI
https://doi.org/10.35848/1347-4065/ad7d95
Primary Topic
Advanced Memory and Neural Computing
Type
article
Field-Weighted Citation Impact
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article

Resistive random access memory based on organic-metallic hybrid polymer

Kairi Shigemori, Norio Onojima, Teppei Sano
Japanese Journal of Applied Physics
Advanced Memory and Neural Computing
article

Resistive random access memory based on organic-metallic hybrid polymer

Kairi Shigemori, Norio Onojima, Teppei Sano
article en

Abstract

Abstract Resistive random access memories (ReRAMs) based on an organic-metallic hybrid polymer, Poly(Fe-btpyb) Purple, were fabricated. This material was synthesized by complexation of metal ion and organic ligand. When applying forward bias, an abrupt resistance change from a low resistance state (LRS) to a high resistance state (HRS), which is known as reset process, was observed. In contrast, a reverse bias switched the resistance from HRS to LRS (set process). The resistive switching phenomenon is probably caused by the electrochemical oxidation-reduction reaction of the metal ion (Fe(II)/Fe(III)). The nonvolatile memory characteristics were measured with data-retention tests, showing no significant degradation over 105 s. The endurance characteristics exhibited sufficient long-term durability, due to no conformational change of the organic ligand. It is proposed that the difference in charge-transfer efficiency between the reduced state (Fe(II)) and oxidized state (Fe(III)) might be the physical mechanism of the resistive switching.

Japanese Journal of Applied Physics
Takeda (Japan) (JP), University of Yamanashi (JP)
Openalex Percentile: Top 87%
Advanced Memory and Neural Computing
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Resistive random access memory based on organic-metallic hybrid polymer — Kairi Shigemori, Norio Onojima, et al. · Japanese Journal of Applied Physics (2024) | TGRS Research Map | TGRS