3D OPC method for GLV parallel scanning lithography microstructure topography control based on SinCUT

A 3D optical proximity correction (OPC) optimization method based on single image contrastive unpaired translation (SinCUT) is proposed for the precise fabrication of 3D microstructures in GLV parallel scanning digital 3D lithography. This method is applied to the optimized fabrication of hyperbolic micro-convex lens arrays. Its fabrication accuracy is demonstrated, showing a significant reduction in the mean square error (MSE) of the morphology. When the lens height is 8.5 µm, the average height error of the lens shape is less than 5%, and the MSE is reduced from 0.727 to 0.0329, resulting in a reduction rate of 92.79%.

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Publication Details

Journal
Optics Express
Published
2024-09-20
DOI
https://doi.org/10.1364/oe.538099
Citations
2
Primary Topic
Advancements in Photolithography Techniques
Type
article
Field-Weighted Citation Impact
0.42

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article

3D OPC method for GLV parallel scanning lithography microstructure topography control based on SinCUT

Hao Cao, Hui Wan, W. Edwards Deming, Chengqun Gui et al.
2 citations
Optics Express
Advancements in Photolithography Techniques
0.42
article

3D OPC method for GLV parallel scanning lithography microstructure topography control based on SinCUT

Hao Cao, Hui Wan, W. Edwards Deming, Chengqun Gui, Shuo Chen, Yu Shu
article en
2 citations

Abstract

A 3D optical proximity correction (OPC) optimization method based on single image contrastive unpaired translation (SinCUT) is proposed for the precise fabrication of 3D microstructures in GLV parallel scanning digital 3D lithography. This method is applied to the optimized fabrication of hyperbolic micro-convex lens arrays. Its fabrication accuracy is demonstrated, showing a significant reduction in the mean square error (MSE) of the morphology. When the lens height is 8.5 µm, the average height error of the lens shape is less than 5%, and the MSE is reduced from 0.727 to 0.0329, resulting in a reduction rate of 92.79%.

Optics ExpressVol. 32(21)
Wuhan University (CN)
National Natural Science Foundation of China
Climate action
Openalex Percentile: Top 38%
Advancements in Photolithography Techniques
0.42
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